High-T/sub c/ RF SQUID magnetometer system for high-resolution magnetic imaging

1993 ◽  
Vol 3 (1) ◽  
pp. 2469-2471 ◽  
Author(s):  
S.S. Tinchev ◽  
J.H. Hinken ◽  
M. Stiller ◽  
A. Baranyak ◽  
D. Hartmann
1992 ◽  
Vol 63 (7) ◽  
pp. 3652-3658 ◽  
Author(s):  
A. D. Hibbs ◽  
R. E. Sager ◽  
D. W. Cox ◽  
T. H. Aukerman ◽  
T. A. Sage ◽  
...  

2001 ◽  
Vol 37 (4) ◽  
pp. 1257-1259 ◽  
Author(s):  
A.A. Companieh ◽  
R. Eaton ◽  
R. Indeck ◽  
M. Moser

2002 ◽  
Vol 242-245 ◽  
pp. 53-58 ◽  
Author(s):  
A.K. Petford-Long ◽  
P. Shang

1993 ◽  
Vol 313 ◽  
Author(s):  
N. J. Zheng ◽  
C. Rau

ABSTRACTWe have developed a novel, high-resolution magnetic imaging technique, scanning-ion microscopy with polarization analysis (SIMPA). In SIMPA, a highly-focused, scanning Ga+ ion beam is used to excite spin-polarized electrons at surfaces of ferromagnetic Materials. By Measuring the intensity and the spin polarization of the emitted electrons using a newly developed, compact mott polarimeter, topographic and magnetic images of magnetic structures are obtained. We report on first SIMPA studies on single-crystalline Fe samples.


Author(s):  
Farouk Nouizi ◽  
Seunghoon Ha ◽  
Maha Algarawi ◽  
Alex Luk ◽  
Mehrnaz Mehrabi ◽  
...  

2020 ◽  
Vol 1559 ◽  
pp. 012013
Author(s):  
Hiroaki Myoren ◽  
Kosuke Okabe ◽  
Ryo Matsunawa ◽  
Kohki Itagaki ◽  
Masato Naruse ◽  
...  

2009 ◽  
Vol 121 (31) ◽  
pp. 5789-5792 ◽  
Author(s):  
Li Yao ◽  
Shoujun Xu

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