High-resolution magnetic imaging based on scanning probe techniques

1996 ◽  
Vol 157-158 ◽  
pp. 545-549 ◽  
Author(s):  
U. Hartmann
1999 ◽  
Vol 11 (48) ◽  
pp. 9387-9402 ◽  
Author(s):  
M Bode ◽  
M Dreyer ◽  
M Getzlaff ◽  
M Kleiber ◽  
A Wadas ◽  
...  

2001 ◽  
Vol 37 (4) ◽  
pp. 1257-1259 ◽  
Author(s):  
A.A. Companieh ◽  
R. Eaton ◽  
R. Indeck ◽  
M. Moser

2002 ◽  
Vol 242-245 ◽  
pp. 53-58 ◽  
Author(s):  
A.K. Petford-Long ◽  
P. Shang

1993 ◽  
Vol 313 ◽  
Author(s):  
N. J. Zheng ◽  
C. Rau

ABSTRACTWe have developed a novel, high-resolution magnetic imaging technique, scanning-ion microscopy with polarization analysis (SIMPA). In SIMPA, a highly-focused, scanning Ga+ ion beam is used to excite spin-polarized electrons at surfaces of ferromagnetic Materials. By Measuring the intensity and the spin polarization of the emitted electrons using a newly developed, compact mott polarimeter, topographic and magnetic images of magnetic structures are obtained. We report on first SIMPA studies on single-crystalline Fe samples.


Author(s):  
Farouk Nouizi ◽  
Seunghoon Ha ◽  
Maha Algarawi ◽  
Alex Luk ◽  
Mehrnaz Mehrabi ◽  
...  

2015 ◽  
Vol 118 (3) ◽  
pp. 034306 ◽  
Author(s):  
Alexandre J. Haemmerli ◽  
Nahid Harjee ◽  
Markus Koenig ◽  
Andrei G. F. Garcia ◽  
David Goldhaber-Gordon ◽  
...  

2009 ◽  
Vol 121 (31) ◽  
pp. 5789-5792 ◽  
Author(s):  
Li Yao ◽  
Shoujun Xu

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