Observation by soft X-ray laser interferometry of Nb cathode surface evolution during very high electric field application

1999 ◽  
Vol 6 (4) ◽  
pp. 418-421
Author(s):  
A. Zeitoun-Fakiris ◽  
M. Boussoukaya ◽  
P. Zeitoun ◽  
F. Albert ◽  
A. Carillon ◽  
...  
1979 ◽  
Vol 30 (2) ◽  
pp. 219-223 ◽  
Author(s):  
S.G. Dinev ◽  
Ch.I. Radev ◽  
K.V. Stamenov ◽  
K.A. Stankov

1983 ◽  
Vol 51 (26) ◽  
pp. 2390-2393 ◽  
Author(s):  
A. H. Moudden ◽  
D. E. Moncton ◽  
J. D. Axe

Author(s):  
N. Yamamoto ◽  
K. Yagi ◽  
G. Honjo

A technique of in-situ application of a dc electric field on a specimen in an electron microscope has been developed to directly observe dynamic phenomena due to the electric field. In the present technique a thickness of a specimen is so thin that a very high electric field can be applied; a few volt of the potential difference across the specimen of the order of 1000 Å thick gives a field as high as 105 V/cm. An additional field application electrode was incorporated not only in a specimen heating holder but also in a liquid helium cooling stage which had been constructed in our 1aboratory. Thus, the experiments could be performed in a wide temperature range of 13-1000K. Fig.la schematically depicts a specimen holder installed in the cooling stage. The detailed arrangement around a specimen is shown in Fig.1b. An electric potential is applied between electrodes of thin A1 films vacuum deposited on the both faces of the specimen.


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