Enhanced angle resolution in scanning beam systems

Author(s):  
C.S. Miller
Keyword(s):  
1999 ◽  
Vol 30 (1) ◽  
pp. 343 ◽  
Author(s):  
A. Gross ◽  
C. Lorenson ◽  
D. Golich

2001 ◽  
Vol 685 ◽  
Author(s):  
M. Fernandes ◽  
Yu. Vygranenko ◽  
J. Martins ◽  
M. Vieira

AbstractWe suggest to enhance the performance of image acquisition systems based on large area amorphous silicon based sensors by optimizing the readout parameters such as the intensity and cross-section of scanner beam, acquisition time and bias conditions. The main output device characteristics as image responsivity, signal to noise ratio and spatial resolution were analyzed in open circuit, short circuit and photodiode modes. The result show that the highest signal to noise ratio and best dark to bright ratio can be achieved in short circuit mode.It was shown that the sensor resolution is related to the basic device parameters and, in practice, limited by the acquisition time and scanning beam properties. The scanning beam spot size limits the resolution due to the overlapping of dark and illuminated zones leading to a blurring effect on the final image and a consequent degradation in the resolution.


2016 ◽  
Vol 3 (1) ◽  
pp. 37-50 ◽  
Author(s):  
Shengpeng Jiang ◽  
Jingqian Wang ◽  
Heng Li ◽  
Li Liao ◽  
Yupeng Li ◽  
...  

2013 ◽  
Vol 86 (1031) ◽  
pp. 20130390 ◽  
Author(s):  
K Iqbal ◽  
M Gillin ◽  
P A Summers ◽  
S Dhanesar ◽  
K A Gifford ◽  
...  

1995 ◽  
Vol 178 (3) ◽  
pp. 261-266 ◽  
Author(s):  
A. E. DIXON ◽  
S. DAMASKINOS ◽  
A. RIBES ◽  
K. M. BEESLEY

2012 ◽  
pp. 615-643
Author(s):  
David Joy
Keyword(s):  

2019 ◽  
Vol 105 (1) ◽  
pp. S89-S90 ◽  
Author(s):  
C.D. Darne ◽  
F. Alsanea ◽  
D.G. Robertson ◽  
Y. Hojo ◽  
N. Sahoo ◽  
...  

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