Comparison of Reflection and Transmission Method and Metal Back Method Measurement of Dielectric properties of transformer oil using free space microwave measurement system in 8 - 12 GHz frequency range

Author(s):  
Mohd Aziz Bin Aris ◽  
Ermeey Abd Kadir ◽  
Deepak Kumar Ghodgaonkar ◽  
Norasimah Khadri
Sensors ◽  
2019 ◽  
Vol 19 (10) ◽  
pp. 2354
Author(s):  
Gerardo Aguila Rodriguez ◽  
Nayda Patricia Arias Duque ◽  
Blanca Estela Gonzalez Sanchez ◽  
Oscar Osvaldo Sandoval Gonzalez ◽  
Oscar Hernan Giraldo Osorio ◽  
...  

A sugar solution measurement system was developed based on the dielectric properties of the sucrose molecule. An ac conductivity and tan δ study as a function of the frequency was performed to find the suitable frequency range for the measuring system. The results indicate that it is possible to obtain a better response of the sensor using the frequencies as the maxima peak in tan δ appears. Developed setup for sucrose solution was appropriate to measure in a 0.15 to 1 g/mL range with an experimental error of about 3%. The proposed system improves the measurement time over some other methods.


2021 ◽  
Vol 21 (1) ◽  
pp. 51-59
Author(s):  
Jin-Seob Kang ◽  
Jeong-Hwan Kim

The electrical properties of materials and their dependence on frequency and temperature are indispensable in designing electromagnetic devices and systems in various areas of engineering and science for both basic and applied researches. A free-space transmission/reflection method measuring the free-space scattering parameters of a material under test (MUT) located at the middle of transmit/receive antennas in a free space is suitable for non-destructively testing the MUT without prior machining or physical contact in high-frequency range. This paper describes a planar offset short applicable to the calibration of a quasi-optic based free-space material measurement system in the millimeter-wave frequency range. The measurement results of the dimensional and electrical properties for the three fabricated planar offset shorts with the phase difference of 120° between the reflection coefficients of the planar shorts in the W-band (75–110 GHz) are presented.


Measurement ◽  
2017 ◽  
Vol 106 ◽  
pp. 179-189 ◽  
Author(s):  
Livia Cerullo ◽  
Johan Winges ◽  
Thomas Rylander ◽  
Tomas McKelvey ◽  
Lubomir Gradinarsky ◽  
...  

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