On the origin of interface induced charge density in ionized cluster beam deposited metal-semiconductor systems
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2014 ◽
Vol 118
(45)
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pp. 26041-26048
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1993 ◽
Vol 70
(6)
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pp. 845-848
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2003 ◽
Vol 24
(3)
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pp. L1-L4
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2018 ◽
Vol 5
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pp. 10-15
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