A modular neural network for R2R diagnosis of semiconductor fabrication equipment: a reactive ion etching application

Author(s):  
Sang Jeen Hong ◽  
G.S. May ◽  
Sungwon Park ◽  
Dong-Chul Park
1993 ◽  
Vol 74 (6) ◽  
pp. 3698-3706 ◽  
Author(s):  
Richard Krukar ◽  
Avi Kornblit ◽  
Linda A. Clark ◽  
Joseph Kruskal ◽  
Diane Lambert ◽  
...  

1996 ◽  
Author(s):  
George F. McLane ◽  
Paul Cooke ◽  
Robert P. Moerkirk

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