A New Methodology for Interconnect Parasitics Extraction Considering Photo-Lithography Effects

Author(s):  
Ying Zhou ◽  
Zhuo Li ◽  
Yuxin Tian ◽  
Weiping Shi ◽  
Frank Liu
2020 ◽  
Vol 56 (1) ◽  
pp. 1-11 ◽  
Author(s):  
Wissam Hamad ◽  
Marwan Bou Sanayeh ◽  
Mustapha M. Hamad ◽  
Werner H. E. Hofmann

Author(s):  
Andy Heinig ◽  
Michael Dittrich ◽  
Sven Reitz ◽  
Jorn Stolle

Author(s):  
Kit Man Cham ◽  
Soo-Young Oh ◽  
Daeje Chin ◽  
John L. Moll

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