Recent research development and new challenges in analog layout synthesis

2016 ◽  
Author(s):  
Mark Po-Hung Lin ◽  
Yao-Wen Chang ◽  
Chih-Ming Hung
Keyword(s):  
Research Development ◽  
Layout Synthesis ◽  
New Challenges ◽  
Analog Layout

A Perspective on Material Handling Engineering: History and New Challenges

1997 ◽  
Vol 119 (4B) ◽  
pp. 835-840
Author(s):  
Ira W. Pence
Keyword(s):  
Material Handling ◽  
Current Status ◽  
Research Development ◽  
75Th Anniversary ◽  
The Status ◽  
Long Time ◽  
New Challenges

It is especially appropriate to consider the status of material handling at this time, as the Material Handling Engineering Division of the ASME marks the 75th Anniversary of its founding. Seventy-five years is a long time, and those of us actively engaged in research, development, and application owe a great debt to those who have gone before, like Jim Allred, Irv Footlik, Walter O’Mally, Ralph Sims, Howard Zollinger, and the like. It would be inappropriate to try to review the current status without reviewing how we got here.

scholarly journals Analog layout synthesis - Recent advances in topological approaches

2009 ◽  
Author(s):  
H. Graeb ◽  
F. Balasa ◽  
R. Castro-Lopez ◽  
Y.-W. Chang ◽  
F.V. Fernandez ◽  
...  
Keyword(s):  
Recent Advances ◽  
Layout Synthesis ◽  
Analog Layout

New challenges to image processing posed by cryo-Electron microscopy of single particles

1991 ◽  
Vol 49 ◽  
pp. 422-423
Author(s):  
Joachim Frank
Keyword(s):  
Electron Microscopy ◽  
Phase Contrast ◽  
Particle Orientation ◽  
Single Particles ◽  
Contrast Transfer Function ◽  
Virtual Absence ◽  
Cryo Electron Microscopy ◽  
Spatial Frequencies ◽  
New Challenges ◽  
Particle Images

Compared with images of negatively stained single particle specimens, those obtained by cryo-electron microscopy have the following new features: (a) higher “signal” variability due to a higher variability of particle orientation; (b) reduced signal/noise ratio (S/N); (c) virtual absence of low-spatial-frequency information related to elastic scattering, due to the properties of the phase contrast transfer function (PCTF); and (d) reduced resolution due to the efforts of the microscopist to boost the PCTF at low spatial frequencies, in his attempt to obtain recognizable particle images.

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