Simulation of Moisture Ingression Ingression in Microelectronics Package to Correlate Accelerated Tests and Field Conditions Reliability

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Andrea Olietti ◽  
Sonia Morin ◽  
Luca Cecchetto ◽  
Lucia Zullino ◽  
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2015 ◽  
Vol 116 (3) ◽  
pp. 165-172 ◽  
Author(s):  
NG Andersen ◽  
PJ Hansen ◽  
K Engell-Sørensen ◽  
LH Nørremark ◽  
P Andersen ◽  
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2020 ◽  
Vol 53 (1) ◽  
Author(s):  
Mirza Faisal Qaseem ◽  
Rahmatullah Qureshi ◽  
Humaira Shaheen ◽  
Abdul Waheed

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