A recursive optimum frequency domain matrix to reduce crest factor in OFDM systems

2014 ◽  
Author(s):  
Pooria Varahram ◽  
Borhanuddin M. Ali ◽  
Somayeh Mohammady ◽  
Nasri B. Sulaiman
Keyword(s):  
Frequency Domain ◽  
Ofdm Systems ◽  
Crest Factor ◽  
Optimum Frequency

scholarly journals FPGA implementation of low complexity crest factor reduction in OFDM systems

2013 ◽  
Author(s):  
Somayeh Mohammady ◽  
Nasri Sulaiman ◽  
Roslina Mohd Sidek ◽  
Mohd Nizar Hamidon ◽  
Pooria Varahram
Keyword(s):  
Low Complexity ◽  
Fpga Implementation ◽  
Ofdm Systems ◽  
Crest Factor ◽  
Crest Factor Reduction

scholarly journals A low complexity high efficiency hybrid multiplicative-additive crest factor reduction for OFDM systems

2016 ◽  
Vol 65 (2) ◽  
pp. 297-307 ◽  
Author(s):  
Khalid Al-Hussaini ◽  
Borhanuddin M. Ali ◽  
Pooria Varahram ◽  
Shaiful Jahari Hashim ◽  
Ronan Farrell
Keyword(s):  
High Efficiency ◽  
Low Complexity ◽  
Ofdm Systems ◽  
Crest Factor ◽  
Crest Factor Reduction

Sum-MSE Gain of DFT-Based Channel Estimator Over Frequency-Domain LS One in Full-Duplex OFDM Systems

2019 ◽  
Vol 13 (2) ◽  
pp. 1231-1240 ◽  
Author(s):  
Jin Wang ◽  
Hai Yu ◽  
Feng Shu ◽  
Jinhui Lu ◽  
Riqing Chen ◽  
...  
Keyword(s):  
Frequency Domain ◽  
Full Duplex ◽  
Ofdm Systems ◽  
Channel Estimator

DAC Testing Using Impulse Signals

2012 ◽  
Vol 19 (1) ◽  
pp. 105-114 ◽  
Author(s):  
Josef Vedral ◽  
Pavel Fexa
Keyword(s):  
Frequency Domain ◽  
Sine Wave ◽  
Testing Time ◽  
Dynamic Parameters ◽  
Effective Number ◽  
Signal To Noise ◽  
Crest Factor ◽  
Multiple Tests ◽  
Digital To Analog Converters ◽  
Band Signal

DAC Testing Using Impulse SignalsThe Multi-Tone (MT) signal with uniform amplitudes can be used for DAC testing. This paper shows an easier way to generate a MT signal using several impulse signals. The article also analyzes qualities of methods for testing the dynamic parameters of Digital to Analog Converters using an impulse signal. The MT, Damped Sine Wave (DSW) and Sinx/x (SINC) signals will be used as the source for these tests. The Effective Number of Bits (ENOB) and Signal to noise and distortion (SINAD) are evaluated in the frequency domain and they are modified using theCrest Factor(CF) correction and compared with the standard results of the Sine Wave FFT test. The first advantage of the test using an impulse signal is that you need fewer input parameters to create the band signal for testing the DAC. The second one is to reduce the testing time using a band signal in comparison with multiple tests using a single sine wave.

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