Real-time measurement and control of junction temperature of VDMOS in power cycle test

Author(s):  
Hang Wei ◽  
Chunsheng Guo ◽  
Hao Guo ◽  
Kun Bai ◽  
Shiwei Feng
2014 ◽  
Vol 30 (3) ◽  
pp. 749-759 ◽  
Author(s):  
Marina Goldfeld ◽  
Jens Christensen ◽  
David Pollard ◽  
Elizabeth R. Gibson ◽  
Jonathon T. Olesberg ◽  
...  

Author(s):  
M. Garg ◽  
M. Zhan ◽  
T.T. Luu ◽  
H. Lakhotia ◽  
T. Klostermann ◽  
...  

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