Non-destructive testing method for chip warpage -Applications of synchrotron radiation X-ray

Author(s):  
Hsueh-Hsien Hsu ◽  
Chang-Meng Wang ◽  
Hsin-Yi Lee ◽  
Albert T. Wu
2000 ◽  
Author(s):  
Ryszard Pyrz

Abstract Among modern measuring techniques, which are designed to reconstruct and to measure three-dimensional aspects of microstructure on mesoscopic scale lengths, the X-ray microtomography seems to be very well suited to yield this information. Generally, X-ray microtomography is the X-ray based non-destructive testing method that was first developed for medical purposes and only recently applied to materials characterization. Monitoring materials’ microstructure using X-ray microtomography allows reconstructing a three-dimensional image of the specimen from non-destructive, serial sections and processing it in order to visualize and measure three-dimensional features. Thus valuable information can be deduced from the correlation of measured stress and strain values with a number of internal geometrical parameters which cannot be measured at the specimen surface.


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