Multiple-step Sampling for Dense Object Detection and Counting

Author(s):  
Zhaoli Deng ◽  
Chenhui Yang
2021 ◽  
Vol 30 ◽  
pp. 2876-2887
Author(s):  
Yi Wang ◽  
Junhui Hou ◽  
Xinyu Hou ◽  
Lap-Pui Chau

Author(s):  
Muhammad Lanang Afkaar Ar ◽  
Sulthan Muzakki Adytia S ◽  
Yudhistira Nugraha ◽  
Farizah Rizka R ◽  
Andy Ernesto ◽  
...  

Author(s):  
Chomtip Pornpanomchai ◽  
Fuangchat Stheitsthienchai ◽  
Sorawat Rattanachuen

Sensors ◽  
2022 ◽  
Vol 22 (2) ◽  
pp. 576
Author(s):  
Shilei Lyu ◽  
Ruiyao Li ◽  
Yawen Zhao ◽  
Zhen Li ◽  
Renjie Fan ◽  
...  

Green citrus detection in citrus orchards provides reliable support for production management chains, such as fruit thinning, sunburn prevention and yield estimation. In this paper, we proposed a lightweight object detection YOLOv5-CS (Citrus Sort) model to realize object detection and the accurate counting of green citrus in the natural environment. First, we employ image rotation codes to improve the generalization ability of the model. Second, in the backbone, a convolutional layer is replaced by a convolutional block attention module, and a detection layer is embedded to improve the detection accuracy of the little citrus. Third, both the loss function CIoU (Complete Intersection over Union) and cosine annealing algorithm are used to get the better training effect of the model. Finally, our model is migrated and deployed to the AI (Artificial Intelligence) edge system. Furthermore, we apply the scene segmentation method using the “virtual region” to achieve accurate counting of the green citrus, thereby forming an embedded system of green citrus counting by edge computing. The results show that the [email protected] of the YOLOv5-CS model for green citrus was 98.23%, and the recall is 97.66%. The inference speed of YOLOv5-CS detecting a picture on the server is 0.017 s, and the inference speed on Nvidia Jetson Xavier NX is 0.037 s. The detection and counting frame rate of the AI edge system-side counting system is 28 FPS, which meets the counting requirements of green citrus.


Author(s):  
Ravishankar Sivalingam ◽  
Guruprasad Somasundaram ◽  
Vassilios Morellas ◽  
Nikolaos Papanikolopoulos ◽  
Osama Lotfallah ◽  
...  

Author(s):  
Y. Pan

The D defect, which causes the degradation of gate oxide integrities (GOI), can be revealed by Secco etching as flow pattern defect (FPD) in both float zone (FZ) and Czochralski (Cz) silicon crystal or as crystal originated particles (COP) by a multiple-step SC-1 cleaning process. By decreasing the crystal growth rate or high temperature annealing, the FPD density can be reduced, while the D defectsize increased. During the etching, the FPD surface density and etch pit size (FPD #1) increased withthe etch depth, while the wedge shaped contours do not change their positions and curvatures (FIG.l).In this paper, with atomic force microscopy (AFM), a simple model for FPD morphology by non-crystallographic preferential etching, such as Secco etching, was established.One sample wafer (FPD #2) was Secco etched with surface removed by 4 μm (FIG.2). The cross section view shows the FPD has a circular saucer pit and the wedge contours are actually the side surfaces of a terrace structure with very small slopes. Note that the scale in z direction is purposely enhanced in the AFM images. The pit dimensions are listed in TABLE 1.


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