On interconnecting circuits with multiple scan chains for improved test data compression

17th International Conference on VLSI Design. Proceedings. ◽

10.1109/icvd.2004.1261016 ◽

2004 ◽

Author(s):

I. Pomeranz ◽

S.M. Reddy

Keyword(s):

Data Compression ◽

Test Data ◽

Test Data Compression ◽

Multiple Scan ◽

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Multilevel-Huffman Test-Data Compression for IP Cores With Multiple Scan Chains

IEEE Transactions on Very Large Scale Integration (VLSI) Systems ◽

10.1109/tvlsi.2008.2000448 ◽

2008 ◽

Vol 16 (7) ◽

pp. 926-931 ◽

Author(s):

Xrysovalantis Kavousianos ◽

Emmanouil Kalligeros ◽

Dimitris Nikolos

Keyword(s):

Data Compression ◽

Test Data ◽

Test Data Compression ◽

Multiple Scan ◽

Scan Chains ◽

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Selective Low-Care Coding: A Means for Test Data Compression in Circuits with Multiple Scan Chains

IEICE Transactions on Fundamentals of Electronics Communications and Computer Sciences ◽

10.1093/ietfec/e89-a.4.996 ◽

2006 ◽

Vol E89-A (4) ◽

pp. 996-1004

Author(s):

Y. SHI

Keyword(s):

Data Compression ◽

Test Data ◽

Test Data Compression ◽

Multiple Scan ◽

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A Multilayer Data Copy Test Data Compression Scheme for Reducing Shifting-in Power for Multiple Scan Design

IEEE Transactions on Very Large Scale Integration (VLSI) Systems ◽

10.1109/tvlsi.2007.899232 ◽

2007 ◽

Vol 15 (7) ◽

pp. 767-776 ◽

Author(s):

Shih-Ping Lin ◽

Chung-Len Lee ◽

Jwu-E Chen ◽

Ji-Jan Chen ◽

Kun-Lun Luo ◽

...

Keyword(s):

Data Compression ◽

Test Data ◽

Test Data Compression ◽

Scan Design ◽

Compression Scheme ◽

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Test data compression technique for embedded cores using virtual scan chains

IEEE Transactions on Very Large Scale Integration (VLSI) Systems ◽

10.1109/tvlsi.2004.830911 ◽

2004 ◽

Vol 12 (7) ◽

pp. 775-781 ◽

Author(s):

A. Jas ◽

B. Pouya ◽

N.A. Touba

Keyword(s):

Data Compression ◽

Test Data ◽

Test Data Compression ◽

Compression Technique ◽

Embedded Cores ◽

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Efficient test data compression and decompression for system-on-a-chip using internal scan chains and Golomb coding

Proceedings Design, Automation and Test in Europe. Conference and Exhibition 2001 ◽

10.1109/date.2001.915015 ◽

2002 ◽

Author(s):

A. Chandra ◽

K. Chakrabarty

Keyword(s):

Data Compression ◽

Test Data ◽

Test Data Compression ◽

Efficient Test ◽

System On A Chip ◽

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Fitting ATE channels with scan chains: a comparison between a test data compression technique and serial loading of scan chains

Third IEEE International Workshop on Electronic Design, Test and Applications (DELTA'06) ◽

10.1109/delta.2006.49 ◽

2006 ◽

Author(s):

J. Dalmasso ◽

M.-L. Flottes ◽

B. Rouzeyre

Keyword(s):

Data Compression ◽

Test Data ◽

Test Data Compression ◽

Compression Technique ◽

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Multi level huffman test data compression with multiple scan chain method

International Conference on Computing and Communication Technologies ◽

10.1109/iccct2.2014.7066738 ◽

2014 ◽

Author(s):

Srikanth Immareddy ◽

Sravan Kumar Talusani

Keyword(s):

Data Compression ◽

Test Data ◽

Test Data Compression ◽

Multiple Scan ◽

Multi Level ◽

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Test data compression and decompression based on internal scan chains and Golomb coding

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/tcad.2002.1004315 ◽

2002 ◽

Vol 21 (6) ◽

pp. 715-722 ◽

Author(s):

A. Chandra ◽

K. Chakrabarty

Keyword(s):

Data Compression ◽

Test Data ◽

Test Data Compression ◽

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A Novel Approach to Drastic Test Data Compression for Multiple Scan Designs

2007 2nd IEEE Conference on Industrial Electronics and Applications ◽

10.1109/iciea.2007.4318693 ◽

2007 ◽

Author(s):

Jing-bo Shao ◽

Tao Zhou ◽

Guang-sheng Ma

Keyword(s):

Data Compression ◽

Test Data ◽

Test Data Compression ◽

Novel Approach ◽

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A Test Data Compression Scheme Based on Mixed Fixed and Variable Length Coding

Chinese Journal of Computers ◽

10.3724/sp.j.1016.2008.01826 ◽

2009 ◽

Vol 31 (10) ◽

pp. 1826-1834 ◽

Author(s):

Wen-Fa ZHAN ◽

Hua-Guo LIANG ◽

Feng SHI ◽

Zheng-Feng HUANG

Keyword(s):

Data Compression ◽

Test Data ◽

Variable Length ◽

Test Data Compression ◽

Compression Scheme ◽

Variable Length Coding

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