scholarly journals Efficient test data compression and decompression for system-on-a-chip using internal scan chains and Golomb coding

2002 ◽  
Author(s):  
A. Chandra ◽  
K. Chakrabarty
Keyword(s):  
Data Compression ◽  
Test Data ◽  
Test Data Compression ◽  
Efficient Test ◽  
System On A Chip ◽  
Scan Chains

Test data compression of system-on-a-chip (SoC) based on partial runs reversing

2010 ◽  
Vol 24 (1) ◽  
pp. 23-28
Author(s):  
Yiming Ouyang ◽  
Baosheng Zou ◽  
Huaguo Liang ◽  
Xi’e Huang
Keyword(s):  
Data Compression ◽  
Test Data ◽  
Test Data Compression ◽  
System On A Chip

Multilevel-Huffman Test-Data Compression for IP Cores With Multiple Scan Chains

2008 ◽  
Vol 16 (7) ◽  
pp. 926-931 ◽  
Author(s):  
Xrysovalantis Kavousianos ◽  
Emmanouil Kalligeros ◽  
Dimitris Nikolos
Keyword(s):  
Data Compression ◽  
Test Data ◽  
Test Data Compression ◽  
Multiple Scan ◽  
Scan Chains ◽  
Ip Cores
Sign in / Sign up

Export Citation Format

Share Document