Multilevel-Huffman Test-Data Compression for IP Cores With Multiple Scan Chains

2008 ◽  
Vol 16 (7) ◽  
pp. 926-931 ◽  
Author(s):  
Xrysovalantis Kavousianos ◽  
Emmanouil Kalligeros ◽  
Dimitris Nikolos
Keyword(s):  
Data Compression ◽  
Test Data ◽  
Test Data Compression ◽  
Multiple Scan ◽  
Scan Chains ◽  
Ip Cores

A Multilayer Data Copy Test Data Compression Scheme for Reducing Shifting-in Power for Multiple Scan Design

2007 ◽  
Vol 15 (7) ◽  
pp. 767-776 ◽  
Author(s):  
Shih-Ping Lin ◽  
Chung-Len Lee ◽  
Jwu-E Chen ◽  
Ji-Jan Chen ◽  
Kun-Lun Luo ◽  
...  
Keyword(s):  
Data Compression ◽  
Test Data ◽  
Test Data Compression ◽  
Scan Design ◽  
Compression Scheme ◽  
Multiple Scan

scholarly journals Run-Length-Based Test Data Compression Techniques: How Far from Entropy and Power Bounds?—A Survey

VLSI Design ◽  
2010 ◽  
Vol 2010 ◽  
pp. 1-9 ◽  
Author(s):  
Usha S. Mehta ◽  
Kankar S. Dasgupta ◽  
Niranjan M. Devashrayee
Keyword(s):  
Data Compression ◽  
Test Data ◽  
Peak Power ◽  
Test Data Compression ◽  
Test Power ◽  
Current Generation ◽  
Run Length ◽  
Coding Schemes ◽  
Entropy Bounds ◽  
Ip Cores

The run length based coding schemes have been very effective for the test data compression in case of current generation SoCs with a large number of IP cores. The first part of paper presents a survey of the run length based codes. The data compression of any partially specified test data depends upon how the unspecified bits are filled with 1s and 0s. In the second part of the paper, the five different approaches for “don't care” bit filling based on nature of runs are proposed to predict the maximum compression based on entropy. Here the various run length based schemes are compared with maximum data compression limit based on entropy bounds. The actual compressions claimed by the authors are also compared. For various ISCAS circuits, it has been shown that when the X filling is done considering runs of zeros followed by one as well as runs of ones followed by zero (i.e., Extended FDR), it provides the maximum data compression. In third part, it has been shown that the average test power and peak power is minimum when the don't care bits are filled to make the long runs of 0s as well as 1s.

Power-Aware Test Data Compression for Embedded IP Cores

2006 ◽  
Author(s):  
N. Badereddine ◽  
Z. Wang ◽  
P. Girard ◽  
K. Chakrabarty ◽  
S. Pravossoudovitch ◽  
...  
Keyword(s):  
Data Compression ◽  
Test Data ◽  
Test Data Compression ◽  
Ip Cores
Sign in / Sign up

Export Citation Format

Share Document