A new technique for obtaining medium current erbium ion beams, for photonics devices, using typical microelectronics ion implanter
A new technique for the measurement of ionization cross sections with crossed electron and ion beams
1985 ◽
Vol 10-11
◽
pp. 204-206
◽
Keyword(s):
Keyword(s):
Keyword(s):
2005 ◽
Vol 25
(1_suppl)
◽
pp. S543-S543