Quantitative assessment of slit mura defect in thin film transistor-liquid crystal display based on chromaticity and optical density

Author(s):  
Fu-Ming Tzu ◽  
Jung-Hua Chou
2020 ◽  
Vol 258 ◽  
pp. 120587 ◽  
Author(s):  
Hau-Ming Chang ◽  
Shiao-Shing Chen ◽  
Zhi-Sheng Cai ◽  
Wen-Shing Chang ◽  
Saikat Sinha Ray ◽  
...  

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