Phase-plane characterization of analog-to-digital converters

Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510) ◽

10.1109/imtc.2004.1351105 ◽

2004 ◽

Author(s):

C.L. Monteiro ◽

P. Arpaia ◽

A.C. Serra

Keyword(s):

Phase Plane ◽

Analog To Digital Converters ◽

Analog To Digital

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Design and Characterization of a Sampling System Based on $\Sigma$–$\Delta$ Analog-to-Digital Converters for Electrical Metrology

IEEE Transactions on Instrumentation and Measurement ◽

10.1109/tim.2008.2010575 ◽

2009 ◽

Vol 58 (4) ◽

pp. 786-790 ◽

Author(s):

R. Iuzzolino ◽

L. Palafox ◽

W.G. Kurten Ihlenfeld ◽

E. Mohns ◽

C. Brendel

Keyword(s):

Analog To Digital Converters ◽

Sampling System ◽

Sigma Delta ◽

Analog To Digital

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Analysis and characterization of cyclic-scale compensated analog-to-digital converters

Nuclear Instruments and Methods ◽

10.1016/0029-554x(79)90274-x ◽

1979 ◽

Vol 165 (2) ◽

pp. 225-230 ◽

Author(s):

E. Gatti ◽

P.F. Manfredi ◽

D. Marino

Keyword(s):

Analog To Digital Converters ◽

Analog To Digital

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Modeling and characterization of sigma-delta analog-to-digital converters

IMTC/98 Conference Proceedings. IEEE Instrumentation and Measurement Technology Conference. Where Instrumentation is Going (Cat. No.98CH36222) ◽

10.1109/imtc.1998.679721 ◽

2002 ◽

Author(s):

P. Arpaia ◽

F. Cennamo ◽

P. Daponte ◽

H. Schumny

Keyword(s):

Analog To Digital Converters ◽

Sigma Delta ◽

Analog To Digital

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Josephson-based characterization of analog-to-digital converters using an equivalent time sampling method

2016 Conference on Precision Electromagnetic Measurements (CPEM 2016) ◽

10.1109/cpem.2016.7540767 ◽

2016 ◽

Author(s):

Blaise Jeanneret ◽

Frederic Overney ◽

Christophe Scherly ◽

Gerald Schaller

Keyword(s):

Sampling Method ◽

Analog To Digital Converters ◽

Time Sampling ◽

Analog To Digital ◽

Equivalent Time

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Single Event Upset Characterization of GHz Analog to Digital Converters with Dynamic Inputs Using a Beat Frequency Test Method

2007 IEEE Radiation Effects Data Workshop ◽

10.1109/redw.2007.4342550 ◽

2007 ◽

Author(s):

Kirby Kruckmeyer ◽

Robert L. Rennie ◽

Dawn H. Ostenberg ◽

Vishwanath Ramachandran ◽

Tareq Hossain

Keyword(s):

Beat Frequency ◽

Analog To Digital Converters ◽

Test Method ◽

Single Event Upset ◽

Single Event ◽

Analog To Digital ◽

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Design and Characterization of Analog-to-Digital Converters using Graphene P-N Junctions

Proceedings of the 25th edition on Great Lakes Symposium on VLSI - GLSVLSI '15 ◽

10.1145/2742060.2742099 ◽

2015 ◽

Author(s):

Roberto Giorgio Rizzo ◽

Sandeep Miryala ◽

Andrea Calimera ◽

Enrico Macii ◽

Massimo Poncino

Keyword(s):

Analog To Digital Converters ◽

Analog To Digital

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Modeling and characterization of sigma-delta analog-to-digital converters

IEEE Transactions on Instrumentation and Measurement ◽

10.1109/tim.2003.809106 ◽

2003 ◽

Vol 52 (3) ◽

pp. 978-983 ◽

Author(s):

P. Arpaia ◽

F. Cennamo ◽

P. Daponte ◽

H. Schumny

Keyword(s):

Analog To Digital Converters ◽

Sigma Delta ◽

Analog To Digital

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Josephson-based test bench for ac characterization of analog-to-digital converters

CPEM 2010 ◽

10.1109/cpem.2010.5544779 ◽

2010 ◽

Author(s):

F. Overney ◽

A. Rufenacht ◽

J.-P. Braun ◽

B. Jeanneret

Keyword(s):

Analog To Digital Converters ◽

Analog To Digital

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Characterization of quantization noise in oversampled analog to digital converters

10.15760/etd.6302 ◽

2000 ◽

Author(s):

Eric Multanen

Keyword(s):

Analog To Digital Converters ◽

Quantization Noise ◽

Analog To Digital

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Noise characterization of analog to digital converters for amplitude and phase noise measurements

Review of Scientific Instruments ◽

10.1063/1.4984948 ◽

2017 ◽

Vol 88 (6) ◽

pp. 065108 ◽

Author(s):

A. C. Cárdenas-Olaya ◽

E. Rubiola ◽

J.-M. Friedt ◽

P.-Y. Bourgeois ◽

M. Ortolano ◽

...

Keyword(s):

Phase Noise ◽

Analog To Digital Converters ◽

Analog To Digital ◽

Noise Measurements ◽

Noise Characterization

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