Single Event Upset Characterization of GHz Analog to Digital Converters with Dynamic Inputs Using a Beat Frequency Test Method

Test Method ◽

Single Event Upset ◽

Single Event ◽

Analog To Digital ◽

Frequency Test

Use of Code Error and Beat Frequency Test Method to Identify Single Event Upset Sensitive Circuits in a 1 GHz Analog to Digital Converter

IEEE Transactions on Nuclear Science ◽

10.1109/tns.2008.921940 ◽

2008 ◽

Vol 55 (4) ◽

pp. 2013-2018 ◽

Cited By ~ 5

Author(s):

Kirby Kruckmeyer ◽

Robert L. Rennie ◽

Vishwanath Ramachandran

Keyword(s):

Beat Frequency ◽

Test Method ◽

Single Event Upset ◽

Analog To Digital Converter ◽

Single Event ◽

Digital Converter ◽

Analog To Digital ◽

Frequency Test

2007 9th European Conference on Radiation and Its Effects on Components and Systems ◽

Use of code error and beat frequency test method to identify single event upset sensitive circuits in a 1GHz analog to digital converter

10.1109/radecs.2007.5205578 ◽

2007 ◽

Author(s):

Kirby Kruckmeyer ◽

Robert L. Rennie ◽

Vishwanath Ramachandran

Keyword(s):

Beat Frequency ◽

Test Method ◽

Single Event Upset ◽

Analog To Digital Converter ◽

Single Event ◽

Digital Converter ◽

Analog To Digital ◽

Frequency Test

1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471) ◽

Proton-induced single event upset characterization of a 1 Giga-sample per second analog to digital converter

10.1109/radecs.1999.858575 ◽

2003 ◽

Cited By ~ 4

Author(s):

R.A. Reed ◽

P.W. Marshall ◽

M.A. Carts ◽

G.L. Henegar ◽

R.B. Katz

Keyword(s):

Single Event Upset ◽

Analog To Digital Converter ◽

Single Event ◽

Digital Converter ◽

Design and Characterization of a Sampling System Based on $\Sigma$–$\Delta$ Analog-to-Digital Converters for Electrical Metrology

IEEE Transactions on Instrumentation and Measurement ◽

10.1109/tim.2008.2010575 ◽

2009 ◽

Vol 58 (4) ◽

pp. 786-790 ◽

Cited By ~ 10

Author(s):

R. Iuzzolino ◽

L. Palafox ◽

W.G. Kurten Ihlenfeld ◽

E. Mohns ◽

C. Brendel

Keyword(s):

Sampling System ◽

Sigma Delta ◽

Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510) ◽

Phase-plane characterization of analog-to-digital converters

10.1109/imtc.2004.1351105 ◽

2004 ◽

Cited By ~ 1

Author(s):

C.L. Monteiro ◽

P. Arpaia ◽

A.C. Serra

Keyword(s):

Phase Plane ◽

Analysis and characterization of cyclic-scale compensated analog-to-digital converters

Nuclear Instruments and Methods ◽

10.1016/0029-554x(79)90274-x ◽

1979 ◽

Vol 165 (2) ◽

pp. 225-230 ◽

Cited By ~ 5

Author(s):

E. Gatti ◽

P.F. Manfredi ◽

D. Marino

Keyword(s):

Neutron, 64 MeV Proton, Thermal Neutron and Alpha Single-Event Upset Characterization of Xilinx 20nm UltraScale Kintex FPGA

2015 IEEE Radiation Effects Data Workshop (REDW) ◽

10.1109/redw.2015.7336723 ◽

2015 ◽

Cited By ~ 11

Author(s):

Pierre Maillard ◽

Michael Hart ◽

Jeff Barton ◽

Praful Jain ◽

James Karp

Keyword(s):

Thermal Neutron ◽

Single Event Upset ◽

Single Event

Single Event Upset Characterization of the Zynq-7000 ARM® Cortex™-A9 Processor Unit Using Proton Irradiation

2015 IEEE Radiation Effects Data Workshop (REDW) ◽

10.1109/redw.2015.7336735 ◽

2015 ◽

Cited By ~ 3

Author(s):

David M. Hiemstra ◽

Valeri Kirischian

Keyword(s):

Proton Irradiation ◽

Single Event Upset ◽

Single Event ◽

Processor Unit

Efficient and accurate testing of analog-to-digital converters using oscillation-test method

Proceedings European Design and Test Conference. ED & TC 97 ◽

10.1109/edtc.1997.582381 ◽

2002 ◽

Cited By ~ 57

Author(s):

K. Arabi ◽

B. Kaminska

Keyword(s):

Test Method ◽

Analog To Digital ◽

Oscillation Test

64 MeV Proton Single-Event Upset Characterization of Customer Memory Interface Design on Xilinx XCKU040 FPGA

2017 IEEE Radiation Effects Data Workshop (REDW) ◽

10.1109/nsrec.2017.8115450 ◽

2017 ◽

Cited By ~ 1

Author(s):

Yanran P. Chen ◽

Pierre Maillard ◽

Michael Hart ◽

Jeff Barton ◽

John Schmitz ◽

...

Keyword(s):

Interface Design ◽

Single Event Upset ◽

Single Event ◽

Memory Interface