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Development of microelectronics reliability technology in China
2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits
◽
10.1109/ipfa.2009.5232709
◽
2009
◽
Cited By ~ 1
Author(s):
Kong Xuedong
◽
Huang Yun
◽
Yang Shaohua
Keyword(s):
Microelectronics Reliability
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References
Impact of low K dielectrics on microelectronics reliability
Canadian Conference on Electrical and Computer Engineering, 2005.
◽
10.1109/ccece.2005.1557029
◽
2006
◽
Cited By ~ 4
Author(s):
D. Scansen
◽
R. Haythornthwaite
◽
S. Brown
Keyword(s):
Microelectronics Reliability
◽
Low K
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Microelectronics reliability predictions derived from component defect densities
Microelectronics Reliability
◽
10.1016/0026-2714(91)90386-l
◽
1991
◽
Vol 31
(1)
◽
pp. 201
Keyword(s):
Microelectronics Reliability
◽
Defect Densities
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Erratum to “A simple and fundamental design rule for resisting delamination in bimaterial structures” [Microelectronics Reliability 2003;43:487–494]
Microelectronics Reliability
◽
10.1016/s0026-2714(03)00116-1
◽
2003
◽
Vol 43
(7)
◽
pp. 1169
Author(s):
Thomas D. Moore
◽
John L. Jarvis
Keyword(s):
Design Rule
◽
Microelectronics Reliability
◽
Fundamental Design
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From chemical building blocks of polymers to microelectronics reliability
5th International Conference on Thermal and Mechanical Simulation and Experiments in Microelectronics and Microsystems 2004 EuroSimE 2004 Proceedings of the ESIME-04
◽
10.1109/esime.2004.1304101
◽
2004
◽
Cited By ~ 2
Author(s):
H.J.L. Bressers
◽
W.D. van Driel
◽
K.M.B. Jansen
◽
L.J. Ernst
◽
G.Q. Zhang
Keyword(s):
Building Blocks
◽
Microelectronics Reliability
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From “Star Trek” to “Avatar”: Microelectronics reliability in the 21st century
2012 IEEE International Reliability Physics Symposium (IRPS)
◽
10.1109/irps.2012.6241758
◽
2012
◽
Author(s):
Carl McCants
Keyword(s):
21St Century
◽
Star Trek
◽
Microelectronics Reliability
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Erratum to “The effect of image potential on electron transmission and electric current in the direct tunneling regime of ultra-thin MOS structures” [Microelectronics Reliability 2001;41:927–931]
Microelectronics Reliability
◽
10.1016/s0026-2714(02)00072-0
◽
2002
◽
Vol 42
(6)
◽
pp. 991
Author(s):
Lingfeng Mao
◽
Changhua Tan
◽
Mingzhen Xu
Keyword(s):
Electric Current
◽
Electron Transmission
◽
Direct Tunneling
◽
Microelectronics Reliability
◽
Mos Structures
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Effect of non-uniform current distribution in the via patterns on microelectronics reliability
Annual Reliability and Maintainability Symposium 1993 Proceedings
◽
10.1109/rams.1993.296820
◽
2002
◽
Author(s):
A.D. Dixit
◽
K. Hirakawa
◽
A. Burghard
Keyword(s):
Current Distribution
◽
Uniform Current
◽
Microelectronics Reliability
◽
Uniform Current Distribution
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Erratum to “An algorithm for calculating the lower confidence bounds of CPU and CPL with application to low-drop-out linear regulators” [Microelectronics Reliability 2003;43:495–502]
Microelectronics Reliability
◽
10.1016/s0026-2714(03)00187-2
◽
2003
◽
Vol 43
(8)
◽
pp. 1349
Author(s):
W.L. Pearn
◽
Ming-Hung Shu
Keyword(s):
Drop Out
◽
Confidence Bounds
◽
Lower Confidence
◽
Microelectronics Reliability
◽
Lower Confidence Bounds
◽
Linear Regulators
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Tutorial: temperature as an input to microelectronics-reliability models
Microelectronics Reliability
◽
10.1016/s0026-2714(97)87699-8
◽
1997
◽
Vol 37
(4)
◽
pp. 697
Keyword(s):
Reliability Models
◽
Microelectronics Reliability
Download Full-text
Chapter 21, New developments in microelectronics reliability
5th International Conference on Thermal and Mechanical Simulation and Experiments in Microelectronics and Microsystems 2004 EuroSimE 2004 Proceedings of the ESIME-04
◽
10.1109/esime.2004.1338224
◽
2004
◽
Keyword(s):
New Developments
◽
Microelectronics Reliability
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