Study on Transmitter with Stacking-MOS Structure of Interface Circuits for Cross-Domain CDM ESD Protection

Mapping Intimacies ◽

10.1109/ipfa53173.2021.9617430 ◽

2021 ◽

Author(s):

Cheng-Yun Hsueh ◽

Ming-Dou Ker

Keyword(s):

Interface Circuits ◽

Mos Structure ◽

Cross Domain ◽

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Optimization on Layout Style of ESD Protection Diode for Radio-Frequency Front-End and High-Speed I/O Interface Circuits

IEEE Transactions on Device and Materials Reliability ◽

10.1109/tdmr.2010.2043433 ◽

2010 ◽

Vol 10 (2) ◽

pp. 238-246 ◽

Author(s):

Chih-Ting Yeh ◽

Ming-Dou Ker ◽

Yung-Chih Liang

Keyword(s):

Radio Frequency ◽

Interface Circuits ◽

Front End ◽

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Quad-SCR Device for Cross-Domain ESD Protection

IEEE Transactions on Electron Devices ◽

10.1109/ted.2016.2579170 ◽

2016 ◽

Vol 63 (8) ◽

pp. 3177-3184 ◽

Author(s):

Federico A. Altolaguirre ◽

Ming-Dou Ker

Keyword(s):

Cross Domain ◽

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Active ESD Protection Design for Interface Circuits Between Separated Power Domains Against Cross-Power-Domain ESD Stresses

IEEE Transactions on Device and Materials Reliability ◽

10.1109/tdmr.2008.2002492 ◽

2008 ◽

Vol 8 (3) ◽

pp. 549-560 ◽

Author(s):

Shih-Hung Chen ◽

Ming-Dou Ker ◽

Hsiang-Pin Hung

Keyword(s):

Interface Circuits ◽

Power Domain ◽

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Stacking-MOS Protection Design for Interface Circuits Against Cross-Domain CDM ESD Stresses

IEEE Transactions on Electron Devices ◽

10.1109/ted.2021.3061325 ◽

2021 ◽

pp. 1-10

Author(s):

Cheng-Yun Hsueh ◽

Ming-Dou Ker

Keyword(s):

Interface Circuits ◽

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ESD Protection Design to Overcome Internal Damage on Interface Circuits of a CMOS IC With Multiple Separated Power Pins

IEEE Transactions on Components and Packaging Technologies ◽

10.1109/tcapt.2004.831762 ◽

2004 ◽

Vol 27 (3) ◽

pp. 445-451 ◽

Author(s):

M.-D. Ker ◽

C.-Y. Chang ◽

Y.-S. Chang

Keyword(s):

Interface Circuits ◽

Internal Damage ◽

Esd Protection ◽

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Resistor-Triggered SCR Device for ESD Protection in High-Speed I/O Interface Circuits

IEEE Electron Device Letters ◽

10.1109/led.2017.2696980 ◽

2017 ◽

Vol 38 (6) ◽

pp. 712-715 ◽

Author(s):

Chun-Yu Lin ◽

Chun-Yu Chen

Keyword(s):

Interface Circuits ◽

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ESD protection design to overcome internal damages on interface circuits of CMOS IC with multiple separated power pins

15th Annual IEEE International ASIC/SOC Conference ◽

10.1109/asic.2002.1158062 ◽

2003 ◽

Author(s):

Ming-Dou Ker ◽

Chyh-Yih Chang ◽

Yi-Shu Chang

Keyword(s):

Interface Circuits ◽

Esd Protection ◽

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Maintaining cross-domain information in working memory, what resources are involved?

PsycEXTRA Dataset ◽

10.1037/e512592013-659 ◽

2011 ◽

Author(s):

N. Langerock ◽

E. Vergauwe ◽

P. Barrouillet

Keyword(s):

Working Memory ◽

Cross Domain ◽

Domain Information

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Evidence of Cross-Domain Attention Limitations in Working Memory

PsycEXTRA Dataset ◽

10.1037/e537052012-454 ◽

2004 ◽

Author(s):

Candice C. Morey ◽

Nelson Cowan

Keyword(s):

Working Memory ◽

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Design of a Dual-directional Diode-triggered SCR for Low Voltage ESD Protection

IEEJ Transactions on Electronics Information and Systems ◽

10.1541/ieejeiss.140.673 ◽

2020 ◽

Vol 140 (6) ◽

pp. 673-674

Author(s):

Qiang Xu ◽

Hailian Liang ◽

Xiaofeng Gu

Keyword(s):

Low Voltage ◽

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