Time-resolved studies using FTIR spectrometers: Molecular dynamics at phase transitions

Author(s):  
Martin Dressel ◽  
Tobias Peterseim
Author(s):  
Oleg Bostanjoglo ◽  
Peter Thomsen-Schmidt

Thin GexTe1-x (x = 0.15-0.8) were studied as a model substance of a composite semiconductor film, in addition being of interest for optical storage material. Two complementary modes of time-resolved TEM were used to trace the phase transitions, induced by an attached Q-switched (50 ns FWHM) and frequency doubled (532 nm) Nd:YAG laser. The laser radiation was focused onto the specimen within the TEM to a 20 μm spot (FWHM). Discrete intermediate states were visualized by short-exposure time doubleframe imaging /1,2/. The full history of a transformation was gained by tracking the electron image intensity with photomultiplier and storage oscilloscopes (space/time resolution 100 nm/3 ns) /3/. In order to avoid radiation damage by the probing electron beam to detector and specimen, the beam is pulsed in this continuous mode of time-resolved TEM,too.Short events ( <2 μs) are followed by illuminating with an extended single electron pulse (fig. 1c)


2005 ◽  
Vol 7 (4) ◽  
pp. 381-390 ◽  
Author(s):  
Ryszard Jakubas ◽  
Beata Bednarska-Bolek ◽  
Jacek Zaleski ◽  
Wojciech Medycki ◽  
Krystyna Hołderna-Natkaniec ◽  
...  

1988 ◽  
Author(s):  
H. W. Tom ◽  
G. D. Aumiller ◽  
C. H. Brito-Cruz

Author(s):  
Yurema Teijeiro-Gonzalez ◽  
Alessandro Crnjar ◽  
Andrew J. Beavil ◽  
Rebecca L. Beavil ◽  
Jakub Nedbal ◽  
...  

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