Fast Hyperspectral Subspace identification using Eigenvalue based energy thresholding

Author(s):  
Dharambhai Shah ◽  
Tanish Zaveri
2005 ◽  
Vol 78 (17) ◽  
pp. 1412-1436 ◽  
Author(s):  
N. L. C. Chui ◽  
J. M. Maciejowski

2021 ◽  
Vol 230 ◽  
pp. 111688
Author(s):  
Nan Jin ◽  
Y.B. Yang ◽  
Elias G. Dimitrakopoulos ◽  
Themelina S. Paraskeva ◽  
Lambros S. Katafygiotis

2014 ◽  
Vol 701-702 ◽  
pp. 492-497
Author(s):  
Teng Yue Ba ◽  
Xi Qiang Guan ◽  
Jian Wu Zhang

In this paper, subspace identification methods are proposed to estimate the linear tire cornering stiffness, which are only based on the road tests data without any prior knowledge. This kind of data-driven method has strong robustness. In order to validate the feasibility and effectiveness of the algorithms, a series of standard road tests are carried out. Comparing with different subspace algorithms used in road tests, it can be concluded that the front tire cornering stiffness can be estimated accurately by the N4SID and CCA methods when the double lane change test data are taken into analysis.


2018 ◽  
Vol 63 (4) ◽  
pp. 1126-1131 ◽  
Author(s):  
Chengpu Yu ◽  
Michel Verhaegen ◽  
Anders Hansson

2014 ◽  
Vol 6 ◽  
pp. 218328 ◽  
Author(s):  
O. Al-Gahtani ◽  
M. El-Gebeily ◽  
Y. Khulief

In this paper we estimate the parameters of a multidimensional system from a record of noisy output measurements by using a multiwavelet denoising technique. In this output-only identification scheme, we extend wavelet denoising methods to the multiwavelet case. After the noise has been removed from the output records by wavelet methods, either full model identification or deterministic subspace identification can be performed. In the former case, full information on the system such as modal values and shapes becomes available by postprocessing. In the latter case, the observable modal values of the system as well as modal shapes at the sensor locations can be extracted from the identified parameters. Additionally, we discuss the requirements on the measuring devices to be compatible with wavelet transforms of a particular type. The validity and merit of the developed scheme are illustrated by examples of numerically simulated and experimentally measured signals, including comparisons with stochastic identification methods.


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