scholarly journals Failure Diagnosis for Cluster Systems using Partial Correlations

Author(s):  
Edward ChuahM ◽  
Arshad Jhumka ◽  
Samantha Alt ◽  
R. Todd Evans ◽  
Neeraj Suri
2003 ◽  
Vol 2 (1) ◽  
pp. 128-129
Author(s):  
P SARMENTO ◽  
C FONSECA ◽  
F MARQUES ◽  
J NUNES ◽  
F CEIA

2008 ◽  
Vol 7 ◽  
pp. 155-156
Author(s):  
T KUMLER ◽  
G GISLASON ◽  
V KIRK ◽  
M BAY ◽  
O NIELSEN ◽  
...  

Crisis ◽  
2014 ◽  
Vol 35 (6) ◽  
pp. 368-377 ◽  
Author(s):  
Sean M. Mitchell ◽  
Danielle R. Jahn ◽  
Kelly C. Cukrowicz

Background: Suicide is the third leading cause of death among college students. The interpersonal theory of suicide may provide a way to conceptualize suicide risk in this population. Aims: We sought to examine relations between illegal behaviors that may act as risk factors for suicide and the acquired capability for suicide. Method: College students (N = 758) completed assessments of acquired capability and previous exposure to painful and provocative events, including illegal risk behaviors (IRBs). Linear regression, a nonparametric bootstrapping procedure, and two-tailed partial correlations were employed to test our hypotheses. Results: There was no significant relation between IRBs and acquired capability after controlling for legal painful and provocative experiences. A significant positive relation was identified between IRBs and fear/anxiety, contradicting the expected relation between increased painful and provocative experiences and lower fear/anxiety. Acquired capability explained variance in the relation between IRBs and history of suicide attempt or self-injury history. Conclusion: Further research is needed to examine links between IRBs and painful and provocative events, particularly to identify the point at which habituation begins to increase acquired capability, as our unexpected results may be due to a lack of habituation to risky behaviors or low variability of scores in the sample.


2020 ◽  
Author(s):  
Joshua R. Polanin ◽  
Dorothy L. Espelage ◽  
Jennifer K. Grotpeter ◽  
Elizabeth Spinney ◽  
Katherine M. Ingram ◽  
...  

2014 ◽  
Vol 0 (3) ◽  
Author(s):  
Mykola V. Fatieiev ◽  
Iryna M. Zaporozhets

Author(s):  
Ruifeng Guo ◽  
Srikanth Venkataraman

Abstract In this paper, we present a scan chain fault diagnosis procedure. The diagnosis for a single scan chain failure is performed in three steps. The first step uses special chain test patterns to determine both the faulty chain and the fault type in the faulty chain. The second step uses a novel procedure to generate special test patterns to identify the suspect scan cell within a range of scan cells. Unlike previously proposed methods that restrict the location of the faulty scan cell only from the scan chain output side, our method restricts the location of the faulty scan cell from both the scan chain output side and the scan chain input side. Hence the number of suspect scan cells is reduced significantly in this step. The final step further improves the diagnostic resolution by ranking the suspect scan cells inside this range. The proposed technique handles both stuck-at and timing failures (transition faults and hold time faults). The experimental results based on simulation and silicon units for several products show the effectiveness of the proposed method.


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