A 47×10Gb/s 1.4mW/(Gb/s) parallel interface in 45nm CMOS

Author(s):  
Frank O'Mahony ◽  
Joseph Kennedy ◽  
James E. Jaussi ◽  
Ganesh Balamurugan ◽  
Mozhgan Mansuri ◽  
...  
Keyword(s):  
Author(s):  
Timothy O. Dickson ◽  
Yong Liu ◽  
Ankur Agrawal ◽  
John F. Bulzacchelli ◽  
Herschel Ainspan ◽  
...  
Keyword(s):  

Author(s):  
Shijie Chen ◽  
Tao Yang ◽  
Xiang Li ◽  
Jian Yang ◽  
Liang Qi ◽  
...  

1983 ◽  
Vol 1 (3) ◽  
pp. 235-243
Author(s):  
D.E Tolmie ◽  
A.G Dornhoff ◽  
S.C Tenbrink

2013 ◽  
Vol 321-324 ◽  
pp. 282-285
Author(s):  
Wei Wang ◽  
Zhan Qi Tang ◽  
Wei Gu ◽  
Kun Liu

In order to study the dilatancy phenomenon of confined granular assembly under shearing in parallel interface, a parallel-panel shear model is constructed by discrete element method (DEM) in this paper. While the relative motion happens between the upper and lower panels, the panel and particles displacement are monitored. The expansion of upper plate and the change of particles force chain are shown. The results show that: the internal particle system keeps repeating the dilatancy and compression process, and the relationship between shear dilatancy phenomenon and force chain structure is close.


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