A 90-nm CMOS 5-GHz Ring-Oscillator PLL With Delay-Discriminator-Based Active Phase-Noise Cancellation

2013 ◽  
Vol 48 (5) ◽  
pp. 1151-1160 ◽  
Author(s):  
Seungkee Min ◽  
Tino Copani ◽  
Sayfe Kiaei ◽  
Bertan Bakkaloglu
Keyword(s):  
Phase Noise ◽  
Active Phase ◽  
Noise Cancellation ◽  
Ring Oscillator ◽  
5 Ghz

DPLL for Phase Noise Cancellation in Ring Oscillator-Based Quadrature Receivers

2017 ◽  
Vol 52 (4) ◽  
pp. 1134-1143 ◽  
Author(s):  
Zuow-Zun Chen ◽  
Yen-Cheng Kuan ◽  
Yilei Li ◽  
Boyu Hu ◽  
Chien-Heng Wong ◽  
...  
Keyword(s):  
Phase Noise ◽  
Noise Cancellation ◽  
Ring Oscillator

Digital PLL for phase noise cancellation in ring oscillator-based I/Q receivers

2016 ◽  
Author(s):  
Zuow-Zun Chen ◽  
Yilei Li ◽  
Yen-Cheng Kuan ◽  
Boyu Hu ◽  
Chien-Heng Wong ◽  
...  
Keyword(s):  
Phase Noise ◽  
Noise Cancellation ◽  
Ring Oscillator

A 4.2–5 GHz, low phase noise LC-VCO with constant bandwidth and small tuning gain

2009 ◽  
Vol 30 (9) ◽  
pp. 095002 ◽  
Author(s):  
Xu Conghui ◽  
Xi Jingtian ◽  
Lu Lei ◽  
Yang Yuqing ◽  
Tan Xi ◽  
...  
Keyword(s):  
Phase Noise ◽  
Constant Bandwidth ◽  
5 Ghz ◽  
Low Phase Noise ◽  
Lc Vco

Ring Oscillator Phase Noise Properties due to PSN with Deterministic Frequency

2012 ◽  
Vol 496 ◽  
pp. 527-533
Author(s):  
Na Bai ◽  
Hong Gang Zhou ◽  
Qiu Lei Wu ◽  
Chun Yu Peng
Keyword(s):  
Phase Noise ◽  
Ring Oscillator ◽  
Cmos Process ◽  
Analysis Method ◽  
Noise Performance ◽  
Supply Noise ◽  
Total Phase ◽  
Phase Noise Performance ◽  
Oscillator Phase Noise ◽  
Oscillator Phase

In this paper, ring oscillator phase noise caused by power supply noise (PSN) with deterministic frequency is analyzed. Results show that phase noise caused by deterministic noise is only an impulse series. Compared with the jitter caused by PSN, the phase noise caused by PSN with deterministic frequency contributes considerably less to total phase noise performance. To verify the analysis method, a CMOS ring oscillator is designed and fabricated using SMIC 0.13 µm CMOS process. Comparisons between the analytical results and measurements prove the accuracy of the proposed method

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