Robust Compressive Two-Dimensional Near-Field Millimeter-Wave Image Reconstruction in Impulsive Noise

2019 ◽  
Vol 26 (4) ◽  
pp. 567-571 ◽  
Author(s):  
Jue Lyu ◽  
Dongjie Bi ◽  
Xifeng Li ◽  
Yongle Xie
Keyword(s):  
Image Reconstruction ◽  
Millimeter Wave ◽  
Impulsive Noise ◽  
Near Field ◽  
Two Dimensional ◽  
Wave Image

Improvement in Image Reconstruction of Scanning Near-Field Millimeter-Wave Microscopy Using a Metal Slit-Type Probe

2001 ◽  
Vol 40 (Part 1, No. 6A) ◽  
pp. 4252-4253 ◽  
Author(s):  
Tatsuo Nozokido ◽  
Hiroyuki Kudo ◽  
Jongsuck Bae ◽  
Koji Mizuno
Keyword(s):  
Image Reconstruction ◽  
Millimeter Wave ◽  
Near Field

Passive Millimeter Wave Image Reconstruction Method based on Compressed Sensing Theory

2013 ◽  
Vol 5 (8) ◽  
pp. 1081-1089
Author(s):  
Yilong Zhang ◽  
Yuehua Li ◽  
Sisi Chen ◽  
Jianqiao Wang ◽  
Jianfei Chen ◽  
...  
Keyword(s):  
Image Reconstruction ◽  
Compressed Sensing ◽  
Millimeter Wave ◽  
Reconstruction Method ◽  
Image Reconstruction Method ◽  
Wave Image

NEAR FIELD IMAGE RECONSTRUCTION ALGORITHM FOR PASSIVE MILLIMETER-WAVE IMAGER BHU-2D-U

2013 ◽  
Vol 45 ◽  
pp. 57-72 ◽  
Author(s):  
Xianxun Yao ◽  
Cheng Zheng ◽  
Jin Zhang ◽  
Baohua Yang ◽  
Anyong Hu ◽  
...  
Keyword(s):  
Image Reconstruction ◽  
Millimeter Wave ◽  
Near Field ◽  
Reconstruction Algorithm ◽  
Image Reconstruction Algorithm

Millimeter-Wave Image Reconstruction Algorithm for One-Stationary Bistatic SAR

2020 ◽  
Vol 68 (3) ◽  
pp. 1185-1194 ◽  
Author(s):  
Zhongmin Wang ◽  
Qijia Guo ◽  
Xianzhong Tian ◽  
Tianying Chang ◽  
Hong-Liang Cui
Keyword(s):  
Image Reconstruction ◽  
Millimeter Wave ◽  
Reconstruction Algorithm ◽  
Image Reconstruction Algorithm ◽  
Bistatic Sar ◽  
Wave Image

scholarly journals Near-Field Scanning Millimeter-Wave Microscope Operating Inside a Scanning Electron Microscope: Towards Quantitative Electrical Nanocharacterization

2021 ◽  
Vol 11 (6) ◽  
pp. 2788
Author(s):  
Petr Polovodov ◽  
Didier Théron ◽  
Clément Lenoir ◽  
Dominique Deresmes ◽  
Sophie Eliet ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Millimeter Wave ◽  
Radiation Effects ◽  
Near Field ◽  
Complex Impedance ◽  
Standard Operating Procedure ◽  
Critical Issue ◽  
Transverse Electromagnetic ◽  
Scanning Electron

The main objectives of this work are the development of fundamental extensions to existing scanning microwave microscopy (SMM) technology to achieve quantitative complex impedance measurements at the nanoscale. We developed a SMM operating up to 67 GHz inside a scanning electron microscope, providing unique advantages to tackle issues commonly found in open-air SMMs. Operating in the millimeter-wave frequency range induces high collimation of the evanescent electrical fields in the vicinity of the probe apex, resulting in high spatial resolution and enhanced sensitivity. Operating in a vacuum allows for eliminating the water meniscus on the tip apex, which remains a critical issue to address modeling and quantitative analysis at the nanoscale. In addition, a microstrip probing structure was developed to ensure a transverse electromagnetic mode as close as possible to the tip apex, drastically reducing radiation effects and parasitic apex-to-ground capacitances with available SMM probes. As a demonstration, we describe a standard operating procedure for instrumentation configuration, measurements and data analysis. Measurement performance is exemplarily shown on a staircase microcapacitor sample at 30 GHz.

Sign in / Sign up

Export Citation Format

Share Document