2T-FN eNVM with 90 nm Logic Process for Smart Card

Author(s):  
Yong Kyu Lee ◽  
Jung Ho Moon ◽  
Young Ho Kim ◽  
Myung-Jo Chun ◽  
Soung-Youb Ha ◽  
...  
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Author(s):  
Uwe Hansmann ◽  
Martin S. Nicklous ◽  
Thomas Schäck ◽  
Frank Seliger

2009 ◽  
Vol 29 (4) ◽  
pp. 950-951
Author(s):  
Xin ZHANG ◽  
Fang-wei LI ◽  
Chun-lan PAN

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Vol 93 ◽  
pp. 103046
Author(s):  
Shasha Liu ◽  
Toshiyuki Yamamoto ◽  
Enjian Yao ◽  
Toshiyuki Nakamura

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