The design of the readout system of two-dimensional position-sensitive GEM detector

Author(s):  
Ma Yichao ◽  
Sun Zhijia ◽  
Zhuang Jian ◽  
Zhou Jianrong ◽  
Zhao Yubin ◽  
...  



1986 ◽  
Vol 19 (3) ◽  
pp. 145-163 ◽  
Author(s):  
U. W. Arndt

The physical processes are examined which can be used for the detection of X-rays in the range between about 3 and about 20 keV and for the positional localization of the incident photons. The criteria for choosing a detector for particular purposes are discussed in general terms. Specific examples of one- and two-dimensional detectors are then considered with particular emphasis on devices which are still in a state of development, and an attempt is made to summarize the nature, performance and suitability for different experiments of available detectors.



1976 ◽  
Vol 19 (8) ◽  
pp. 1111-1113
Author(s):  
Yu. P. Artemov ◽  
L. A. Bakumov ◽  
V. P. Blagikh ◽  
E. A. Khesed ◽  
Ya. L. Khlyavich


2019 ◽  
Vol 1400 ◽  
pp. 055050
Author(s):  
A A Bogdanov ◽  
I V Eremin ◽  
Yu V Chichagov ◽  
V K Eremin ◽  
Yu V Tuboltsev ◽  
...  


2015 ◽  
Vol 719-720 ◽  
pp. 580-583
Author(s):  
Xin Wen Duan ◽  
Ye Sun

This paper introduces a kind of measuring system based on two-dimensional position sensitive detector PSD and single-chip signal processing, and have discussed the key technology. Two-dimensional position sensitive detector (2 D-PSD) is a kind of testing device of light spot position information and the output signal is a kind of current signal related to the location information. PSD output signal processing circuits are usually made by the I/V conversion circuit ,the addition, the subtraction and division arithmetic circuit. System can quickly, accurately and easily realize the position measurement, with a simple implementation, low power consumption, fast response, etc, It can be applied to many remote laser center positioning measurement and general industrial control occasions.



Author(s):  
P.M. Zagwijn ◽  
A.M. Molenbroek ◽  
J. Vrijmoeth ◽  
G.J. Ruwiel ◽  
R.M. Uiterlinden ◽  
...  


2018 ◽  
Vol 39 (2) ◽  
pp. 232-235 ◽  
Author(s):  
Tianqi Zhao ◽  
Yu Peng ◽  
Baicheng Li ◽  
Ran He ◽  
Kun Liang ◽  
...  


1988 ◽  
Vol 32 ◽  
pp. 397-406 ◽  
Author(s):  
G.M. Borgonovi ◽  
C.P. Gazza

Conventional methods of determination of residual stress in polycrystalline samples use either diffractometers or one-dimensional position-sensitive detectors. The most commonly used technique, the so-called "sin2ψ" method, requires several measurements at different angular positions of the sample. With diffractometers, two rotations are required, while with one-dimensional detectors, one rotation is required (except for the so-called single exposure technique, which requires two one-dimensional position-sensitive detectors). Rotation can be a potential source of errors if the sample is not aligned very carefully.



Optik ◽  
2019 ◽  
Vol 184 ◽  
pp. 399-411
Author(s):  
Fan Zhang ◽  
Jin Liu ◽  
Haima Yang ◽  
Haishan Liu ◽  
Yuan Chen ◽  
...  




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