Stress Measurements with a Two-Dimensional Real-Time System

1988 ◽  
Vol 32 ◽  
pp. 397-406 ◽  
Author(s):  
G.M. Borgonovi ◽  
C.P. Gazza
Keyword(s):  
Two Dimensional ◽  
Single Exposure ◽  
Time System ◽  
Real Time System ◽  
One Dimensional ◽  
Potential Source ◽  
Position Sensitive ◽  
Position Sensitive Detectors ◽  
Exposure Technique

Conventional methods of determination of residual stress in polycrystalline samples use either diffractometers or one-dimensional position-sensitive detectors. The most commonly used technique, the so-called "sin2ψ" method, requires several measurements at different angular positions of the sample. With diffractometers, two rotations are required, while with one-dimensional detectors, one rotation is required (except for the so-called single exposure technique, which requires two one-dimensional position-sensitive detectors). Rotation can be a potential source of errors if the sample is not aligned very carefully.

Design of a Real-Time Two-Dimensional Residual Stress Analyzer

1986 ◽  
Vol 30 ◽  
pp. 523-526
Author(s):  
G. M. Borgonovi
Keyword(s):  
Residual Stress ◽  
Two Dimensional ◽  
X Ray Diffraction ◽  
Detector Plane ◽  
Flat Detector ◽  
One Dimensional ◽  
X Ray ◽  
State Of Stress ◽  
Position Sensitive ◽  
Position Sensitive Detectors

Measurements of residual stress by X-ray diffraction are usually carried out with diffractometers or with one-dimensional position sensitive detectors. The stress is determined from the displacement of the peak that results from intersecting a diffraction cone at high angle with the line scanned by the detector. If a two-dimensional flat detector is used, the intersection of the diffraction cone with the detector plane is a ring, or section of a ring, which is also slightly displaced by the stress. The suggestion has been made use a two-dimensional detector to determine the surface state of stress.

X-ray position-sensitive detectors

1986 ◽  
Vol 19 (3) ◽  
pp. 145-163 ◽  
Author(s):  
U. W. Arndt
Keyword(s):  
X Rays ◽  
Two Dimensional ◽  
Physical Processes ◽  
X Ray ◽  
General Terms ◽  
Position Sensitive ◽  
Position Sensitive Detectors

The physical processes are examined which can be used for the detection of X-rays in the range between about 3 and about 20 keV and for the positional localization of the incident photons. The criteria for choosing a detector for particular purposes are discussed in general terms. Specific examples of one- and two-dimensional detectors are then considered with particular emphasis on devices which are still in a state of development, and an attempt is made to summarize the nature, performance and suitability for different experiments of available detectors.

scholarly journals Determination of hard X-ray polarization from two-dimensional images

2020 ◽  
Vol 53 (6) ◽  
pp. 1559-1561
Author(s):  
Robert B. Von Dreele ◽  
Wenqian Xu
Keyword(s):  
Incident Beam ◽  
Beam Polarization ◽  
Two Dimensional ◽  
One Dimensional ◽  
X Ray ◽  
Dimensional Image ◽  
Two Dimensional Image ◽  
The Difference ◽  
Two Dimensional Images

An estimate of synchrotron hard X-ray incident beam polarization is obtained by partial two-dimensional image masking followed by integration. With the correct polarization applied to each pixel in the image, the resulting one-dimensional pattern shows no discontinuities arising from the application of the mask. Minimization of the difference between the sums of the masked and unmasked powder patterns allows estimation of the polarization to ±0.001.

Fourier synthesis image reconstruction by use of one-dimensional position-sensitive detectors

2003 ◽  
Vol 42 (20) ◽  
pp. 4176 ◽  
Author(s):  
Jun′ichi Kotoku ◽  
Kazuo Makishima ◽  
Yuu Okada ◽  
Hitoshi Negoro ◽  
Yukikatsu Terada ◽  
...  
Keyword(s):  
Image Reconstruction ◽  
Fourier Synthesis ◽  
One Dimensional ◽  
Position Sensitive ◽  
Position Sensitive Detectors

Determination of a convex body from the average of projections and stability results

1998 ◽  
Vol 123 (3) ◽  
pp. 561-569 ◽  
Author(s):  
K. K. SPRIESTERSBACH
Keyword(s):  
Convex Body ◽  
Two Dimensional ◽  
One Dimensional ◽  
Random Sections ◽  
Standard Projection ◽  
Stability Results ◽  
Projection Bodies

Analysis of projections of a convex body is a familiar topic in tomography. However, instead of considering standard projection bodies, this work investigates a convex body introduced by Schneider [8] which is a Minkowski average of projections. The question addressed here is similar to that posed by Goodey and Weil [4] with respect to Minkowski averages of sections, as opposed to projections, that is, can the shape of a convex body be determined from random sections? Their main result shows that a body K is determined by the average of its two-dimensional sections, but not by the average of its one-dimensional sections. The goal of this study is to uncover the extent to which a convex body is determined by the average of its projections.

PSD Sensor Decomposing Multiple Light Spots

2006 ◽  
Vol 18 (1) ◽  
pp. 97-102 ◽  
Author(s):  
Susumu Kouno ◽  
Keyword(s):  
High Speed ◽  
One Dimensional ◽  
Psd Sensor ◽  
Working Principle ◽  
Position Sensitive ◽  
Position Sensitive Detectors ◽  
Speed Response

Position-sensitive detectors (PSDs) detect light spots point and total lights focused on it. The PSD provides high-speed response and precision due to its simple working principle. Inexpensive one-dimensional (1D) PSDs are commercially available, but when multiple lights focus on the PSD, it can only the center of multiple light positions making it unable to detect individual light positions separately. We propose a sensor that breaks down multiple light spots individua1ys by combing the rotation of a polygon mirror and two 1D PSDs. We consider how many light spots is broken down. We designed and developed a PSD sensor consisting of two 1D PSDs, a polygon mirror, and an actuator for rotating the polygon mirror. We broke down multiple light spots into individuals in scanning at 50.8Hz.

Insights on Amorphous Silicon Nip and MIS 3D Position Sensitive Detectors

2006 ◽  
Vol 514-516 ◽  
pp. 13-17 ◽  
Author(s):  
Rodrigo Martins ◽  
Daniel Costa ◽  
Hugo Águas ◽  
Fernanda Soares ◽  
António Marques ◽  
...  
Keyword(s):  
Amorphous Silicon ◽  
Image Resolution ◽  
Mis Structure ◽  
Silicon Thin Film ◽  
One Dimensional ◽  
Operation Conditions ◽  
Plane Image ◽  
Position Sensitive ◽  
Position Sensitive Detectors ◽  
Better Than

This work aims to report results of the spatial and frequency optical detection limits of integrated arrays of 32 one-dimensional amorphous silicon thin film position sensitive detectors with nip or MIS structure, under continuous and pulsed laser operation conditions. The arrays occupy a total active area of 45 mm2 and have a plane image resolution better than 15 m with a cut-off frequency of about 6.8 kHz. The non-linearity of the array components varies with the frequency, being about 1.6% for 200 Hz and about 4% for the cut-off frequency (6.8 kHz).

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