Initial and radiation-induced charge distribution in silicon oxynitride MIS structures

IEEE Transactions on Electron Devices ◽

10.1109/t-ed.1971.17206 ◽

1971 ◽

Vol 18 (6) ◽

pp. 384-386 ◽

Author(s):

J.D. Ashner

Keyword(s):

Charge Distribution ◽

Silicon Oxynitride ◽

Radiation Induced ◽

Induced Charge ◽

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Model for Radiation‐Induced Charge Trapping and Annealing in the Oxide Layer of MOS Devices

Journal of Applied Physics ◽

10.1063/1.1657309 ◽

1969 ◽

Vol 40 (12) ◽

pp. 4886-4892 ◽

Author(s):

C. W. Gwyn

Keyword(s):

Oxide Layer ◽

Charge Trapping ◽

Mos Devices ◽

Radiation Induced ◽

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Radiation-induced charge transfer inefficiency in charge-coupled devices: Sentinel-4 CCD pre-development as a case study

10.1117/12.2072625 ◽

2014 ◽

Author(s):

T. Prod'homme ◽

J.-M. Belloir ◽

H. Weber ◽

G. Bazalgette Courrèges-Lacoste ◽

R. Meynart ◽

...

Keyword(s):

Charge Transfer ◽

Charge Coupled Devices ◽

Radiation Induced ◽

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The Role of Radiation Induced Charge Migration with DNA: ESR Studies

The Early Effects of Radiation on DNA ◽

10.1007/978-3-642-75148-6_12 ◽

1991 ◽

pp. 111-124 ◽

Author(s):

Martyn C. R. Symons

Keyword(s):

Charge Migration ◽

Radiation Induced ◽

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The effect of process variations on interfacial and radiation-induced charge in silicon-on-sapphire capacitors

IEEE Transactions on Electron Devices ◽

10.1109/t-ed.1978.19210 ◽

1978 ◽

Vol 25 (8) ◽

pp. 978-982 ◽

Author(s):

J.L. Repace ◽

A.M. Goodman

Keyword(s):

Process Variations ◽

Radiation Induced ◽

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Effect of radiation-induced charge on 1/f noise in MOS devices

IEEE Transactions on Nuclear Science ◽

10.1109/23.101179 ◽

1990 ◽

Vol 37 (6) ◽

pp. 1696-1702 ◽

Author(s):

T.L. Meisenheimer ◽

D.M. Fleetwood

Keyword(s):

Mos Devices ◽

Radiation Induced ◽

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Comparison of radiation-induced charge sharing generated by heavy ion and pulsed laser

2016 16th European Conference on Radiation and Its Effects on Components and Systems (RADECS) ◽

10.1109/radecs.2016.8093187 ◽

2016 ◽

Author(s):

Song Ruiqiang ◽

Chen Shuming ◽

Han Jianwei ◽

Chi Yaqing ◽

Chen Rui ◽

...

Keyword(s):

Pulsed Laser ◽

Heavy Ion ◽

Charge Sharing ◽

Radiation Induced ◽

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Radiation Induced Charge Trapping in Sputtered ${\rm ZrO}_{\rm 2} \!\! : \!\! {\rm N}$ Dielectric Thin Films on Silicon

IEEE Transactions on Nuclear Science ◽

10.1109/tns.2014.2329752 ◽

2014 ◽

Vol 61 (4) ◽

pp. 2397-2401 ◽

Author(s):

Ashwath Rao ◽

Joyline D'sa ◽

Saurabh Goyal ◽

B. R. Singh

Keyword(s):

Charge Trapping ◽

Dielectric Thin Films ◽

Radiation Induced ◽

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Radiation Induced Charge Trapping in Ultrathin ${\rm HfO}_{2}$-Based MOSFETs

IEEE Transactions on Nuclear Science ◽

10.1109/tns.2007.911423 ◽

2007 ◽

Vol 54 (6) ◽

pp. 1883-1890 ◽

Author(s):

Sriram K. Dixit ◽

Xing J. Zhou ◽

Ronald D. Schrimpf ◽

Daniel M. Fleetwood ◽

Sokrates T. Pantelides ◽

...

Keyword(s):

Charge Trapping ◽

Radiation Induced ◽

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Drift of radiation-induced charge carriers in liquid sulfur hexafluoride

Journal of Electrostatics ◽

10.1016/0304-3886(82)90066-3 ◽

1982 ◽

Vol 12 ◽

pp. 59-63 ◽

Author(s):

H. Jungblut ◽

W. Döldissen ◽

W.F. Schmidt

Keyword(s):

Sulfur Hexafluoride ◽

Charge Carriers ◽

Liquid Sulfur ◽

Radiation Induced ◽

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Radiation-induced charge-transfer luminescence and its primary processes in toluene

International Journal for Radiation Physics and Chemistry ◽

10.1016/0020-7055(75)90016-9 ◽

1975 ◽

Vol 7 (4) ◽

pp. 519-527 ◽

Author(s):

H. Masuhara ◽

T. Miyazaki ◽

N. Mataga ◽

Z. Kuri

Keyword(s):

Charge Transfer ◽

Radiation Induced ◽

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