On the Plane Wave-Excited Subwavelength Circular Aperture in a Thin Perfectly Conducting Flat Screen

2014 ◽  
Vol 62 (4) ◽  
pp. 2121-2129 ◽  
Author(s):  
Krzysztof A. Michalski ◽  
Juan R. Mosig
Keyword(s):  
Plane Wave ◽  
Circular Aperture ◽  
Flat Screen

A NOTE ON THE DIFFRACTION OF A SCALAR WAVE BY A SMALL CIRCULAR APERTURE

1961 ◽  
Vol 39 (7) ◽  
pp. 1065-1070 ◽  
Author(s):  
R. A. Hurd
Keyword(s):  
Power Series ◽  
Plane Wave ◽  
Transmission Coefficient ◽  
Series Solution ◽  
Recurrence Relations ◽  
Power Series Solution ◽  
Circular Aperture ◽  
Scalar Wave ◽  
Simple Method ◽  
Plane Wave Incident

The power series solution for the diffraction of a scalar plane wave incident normally on a small circular aperture in a hard screen is extended to include terms of order α12 in the aperture field, and to terms of order α10 in the transmission coefficient (α = 2π × radius of aperture/wavelength). To do this, a set of recurrence relations is developed, and a relatively simple method of obtaining the transmission coefficient is devised.

The on-axis phase and group velocities of plane wave diffracted by a small circular aperture

2003 ◽  
Vol 224 (4-6) ◽  
pp. 205-211 ◽  
Author(s):  
Guoquan Zhou ◽  
Shaomin Wang ◽  
Daomu Zhao ◽  
Jinxin Xu
Keyword(s):  
Plane Wave ◽  
Circular Aperture ◽  
Phase And Group Velocities ◽  
Group Velocities

Theory and Errors in Stereo Electron Microscopy

1968 ◽  
Vol 26 ◽  
pp. 336-337
Author(s):  
J. M. Pankratz
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Plane Wave ◽  
Focal Length ◽  
Foil Thickness ◽  
Points Of Interest ◽  
Transmission Electron ◽  
Vertical Spacing ◽  
Illuminating System

It is often desirable in transmission electron microscopy to know the vertical spacing of points of interest within a specimen. However, in order to measure a stereo effect, one must have two pictures of the same area taken from different angles, and one must have also a formula for converting measured differences between corresponding points (parallax) into a height differential.Assume (a) that the impinging beam of electrons can be considered as a plane wave and (b) that the magnification is the same at the top and bottom of the specimen. The first assumption is good when the illuminating system is overfocused. The second assumption (the so-called “perspective error”) is good when the focal length is large (3 x 107Å) in relation to foil thickness (∼103 Å).

A hybrid Gaussian and plane wave density functional scheme

1997 ◽  
Vol 92 (3) ◽  
pp. 477-487 ◽  
Author(s):  
GERALD LIPPERT ◽  
JuRG HUTTER ◽  
MICHELE PARRINELLO
Keyword(s):  
Plane Wave ◽  
Density Functional ◽  
Functional Scheme
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