Statistical Distribution of the Normalized Difference Polarization Index for 3-D Layered Structures With Slightly Rough Interfaces

2019 ◽  
Vol 67 (6) ◽  
pp. 4291-4295 ◽  
Author(s):  
Saddek Afifi ◽  
Richard Dusseaux
Keyword(s):  
Layered Structures ◽  
Statistical Distribution ◽  
Polarization Index ◽  
Rough Interfaces

Effect of high pressure-temperature on silicon layered structures as determined by X-ray diffraction and electron microscopy

2004 ◽  
Vol 27 (1-3) ◽  
pp. 415-418
Author(s):  
J. Bak-Misiuk ◽  
A. Misiuk ◽  
J. Ratajczak ◽  
A. Shalimov ◽  
I. Antonova ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
High Pressure ◽  
Layered Structures ◽  
X Ray Diffraction ◽  
X Ray
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