Precise Determination of the Threshold Current for Third-Harmonic Voltage Generation in the ac Inductive Measurement of Critical Current Densities of Superconducting Thin Films

2005 ◽  
Vol 15 (2) ◽  
pp. 3636-3639 ◽  
Author(s):  
H. Yamasaki ◽  
Y. Mawatari ◽  
Y. Nakagawa
Keyword(s):  
Thin Films ◽  
Threshold Current ◽  
Precise Determination ◽  
Superconducting Thin Films ◽  
Third Harmonic ◽  
Harmonic Voltage ◽  
Current Densities ◽  
Inductive Measurement ◽  
Voltage Generation

Precise determination of absolute coverage of thin films by layer-resolved surface states

2008 ◽  
Vol 92 (16) ◽  
pp. 163102 ◽  
Author(s):  
Cheng-Maw Cheng ◽  
Ku-Ding Tsuei ◽  
Chi-Ting Tsai ◽  
Dah-An Luh
Keyword(s):  
Thin Films ◽  
Surface States ◽  
Precise Determination

Determination of critical current densities of YBa2Cu3O7−δ thin films from AC susceptibility measurements

1993 ◽  
Vol 205 (3-4) ◽  
pp. 311-322 ◽  
Author(s):  
W. Xing ◽  
B. Heinrich ◽  
J. Chrzanowski ◽  
J.C. Irwin ◽  
H. Zhou ◽  
...  
Keyword(s):  
Thin Films ◽  
Critical Current ◽  
Ac Susceptibility ◽  
Current Densities

X-ray Line Broadening Analysis of Tl-Superconducting Films

1989 ◽  
Vol 33 ◽  
pp. 145-151
Author(s):  
M. O. Eatough ◽  
D. S. Ginley ◽  
B. Morosin
Keyword(s):  
Thin Films ◽  
Superconducting Films ◽  
Electron Beam Evaporation ◽  
Superconducting Thin Films ◽  
Line Broadening ◽  
X Ray Diffraction ◽  
X Ray ◽  
Current Densities ◽  
Diffraction Peaks ◽  
Sequential Electron

AbstractSuperconducting thin films (0.3-0.7μm) in the TI-Ca-Ba-Cu-0 system have been prepared on various single crystal substrates by sequential electron beam evaporation followed by appropriate sintering and annealing. Oxygen-annealed films show Tc as high as 110K and critical current densities to 600,000 A/cm2. X-ray diffraction analyses of these films show predominantly the Tl2Ca2Ba2Cu2O10 phase (c-parameter near 36Å), but some also contain up to 50 at% of the Tl2CaBa2Cu2O8 phase (c-parameter near 30Å). The complete absence of hkl reflections other than 00I demonstrates the highly oriented nature of the films as well as the absence of other Tl phases. The diffraction peaks are noticeably broader for the 36Å phase than for the 30Å phase. For a 0.7μm film such broadening is consistent with coherent sizes along the c-axis of 1200 - 1400Å and 500Å, respectively, for the 30Å and 36Å phases, and of strain values near 1.4-1.8 x 10-3 for both phases.

A dual-styli micro-machined system for precise determination of the thickness of free-standing thin films

2014 ◽  
Author(s):  
Zhi Li ◽  
Sai Gao ◽  
Helmut Wolff ◽  
Uwe Brand ◽  
Ludger Koenders
Keyword(s):  
Thin Films ◽  
Precise Determination ◽  
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