Current Limiting Properties of MOD-YBCO Thin Films Stabilized With High-Resistivity Alloy Shunt Layer

2007 ◽  
Vol 17 (2) ◽  
pp. 3479-3482 ◽  
Author(s):  
M. Furuse ◽  
H. Yamasaki ◽  
T. Manabe ◽  
M. Sohma ◽  
W. Kondo ◽  
...  
Keyword(s):  
Thin Films ◽  
High Resistivity ◽  
Ybco Thin Films ◽  
Current Limiting

Terahertz responses of high-resistivity YBCO thin films

2003 ◽  
Vol 391 (3) ◽  
pp. 281-288 ◽  
Author(s):  
Tsong-Ru Tsai ◽  
Cheng-Chung Chi ◽  
Sheng-Fu Horng
Keyword(s):  
Thin Films ◽  
High Resistivity ◽  
Ybco Thin Films

scholarly journals Development of kA Class Fault Current Limiting Unit with YBCO Thin Films

2005 ◽  
Vol 125 (10) ◽  
pp. 1007-1014 ◽  
Author(s):  
Kenji Shimohata ◽  
Syoichi Yokoyama ◽  
Itsuo Kodera ◽  
Kenji Yasuda
Keyword(s):  
Thin Films ◽  
Fault Current ◽  
Ybco Thin Films ◽  
Current Limiting

Breakdown of YBCO thin films during current limiting and methods of improving current limiting performance

2009 ◽  
Vol 166 (1) ◽  
pp. 20-27 ◽  
Author(s):  
Akifumi Ootani ◽  
Tetsuo Hori ◽  
Mikihiko Endo ◽  
Mitsuho Furuse ◽  
Iwao Yamaguchi ◽  
...  
Keyword(s):  
Thin Films ◽  
Ybco Thin Films ◽  
Current Limiting

Study of kV Class Current Limiting Unit With YBCO Thin Films

2007 ◽  
Vol 17 (2) ◽  
pp. 1986-1989 ◽  
Author(s):  
T. Hori ◽  
M. Endo ◽  
T. Koyama ◽  
I. Yamaguchi ◽  
K. Kaiho ◽  
...  
Keyword(s):  
Thin Films ◽  
Ybco Thin Films ◽  
Current Limiting

STUDY OF THE PREPARATION OF HIGH Tc SUPERCONDUCTING YBCO THIN FILMS BY A PLASMA-ASSISTED MOCVD PROCESS

1989 ◽  
Vol 50 (C5) ◽  
pp. C5-149-C5-153
Author(s):  
DING-KUN PENG ◽  
GUANG-YAO MENG ◽  
CHUN-BAO CAO ◽  
CHUN-LIN WANG ◽  
QI FANG ◽  
...  
Keyword(s):  
Thin Films ◽  
High Tc ◽  
Ybco Thin Films

scholarly journals Tuning the Electrical Properties of NiO Thin Films by Stoichiometry and Microstructure

Coatings ◽  
2021 ◽  
Vol 11 (6) ◽  
pp. 697
Author(s):  
Yu-He Liu ◽  
Xiao-Yan Liu ◽  
Hui Sun ◽  
Bo Dai ◽  
Peng Zhang ◽  
...  
Keyword(s):  
Thin Films ◽  
Electrical Properties ◽  
Energy Loss ◽  
Single Crystal ◽  
Oxygen Stoichiometry ◽  
High Resistivity ◽  
Edge Structure ◽  
Glass Substrates ◽  
Lower Resistivity

Here, the electrical properties of NiO thin films grown on glass and Al2O3 (0001) substrates have been investigated. It was found that the resistivity of NiO thin films strongly depends on oxygen stoichiometry. Nearly perfect stoichiometry yields extremely high resistivity. In contrast, off-stoichiometric thin films possess much lower resistivity, especially for oxygen-rich composition. A side-by-side comparison of energy loss near the edge structure spectra of Ni L3 edges between our NiO thin films and other theoretical spectra rules out the existence of Ni3+ in NiO thin films, which contradicts the traditional hypothesis. In addition, epitaxial NiO thin films grown on Al2O3 (0001) single crystal substrates exhibit much higher resistivity than those on glass substrates, even if they are deposited simultaneously. This feature indicates the microstructure dependence of electrical properties.

Summation of Flux Pinning by Columnar Defects Tilted at Different Angles in YBCO Thin Films

2021 ◽  
Vol 31 (5) ◽  
pp. 1-5
Author(s):  
Tetsuro Sueyoshi ◽  
Ryusei Enokihata ◽  
Hiroshi Yamaguchi ◽  
Takanori Fujiyoshi ◽  
Yasuki Okuno ◽  
...  
Keyword(s):  
Thin Films ◽  
Flux Pinning ◽  
Ybco Thin Films ◽  
Columnar Defects
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