A Statistical Algorithm for Power- and Timing-Limited Parametric Yield Optimization of Large Integrated Circuits

2007 ◽  
Vol 26 (10) ◽  
pp. 1790-1802 ◽  
Author(s):  
Murari Mani ◽  
Anirudh Devgan ◽  
Michael Orshansky ◽  
Yaping Zhan
Keyword(s):  
Integrated Circuits ◽  
Yield Optimization ◽  
Parametric Yield ◽  
Statistical Algorithm

Efficient parametric yield optimization of VLSI circuit by uniform design sampling method

2005 ◽  
Vol 45 (1) ◽  
pp. 155-162 ◽  
Author(s):  
Ming-e Jing ◽  
Yue Hao ◽  
Jin-feng Zhang ◽  
Pei-jun Ma
Keyword(s):  
Sampling Method ◽  
Uniform Design ◽  
Vlsi Circuit ◽  
Yield Optimization ◽  
Parametric Yield

Statistically based parametric yield prediction for integrated circuits

1997 ◽  
Vol 10 (4) ◽  
pp. 445-458 ◽  
Author(s):  
D.S. Gibson ◽  
R. Poddar ◽  
G.S. May ◽  
M.A. Brooke
Keyword(s):  
Integrated Circuits ◽  
Yield Prediction ◽  
Parametric Yield

Parametric yield optimization of MEMS

2002 ◽  
Author(s):  
Flavien Delauche ◽  
Bachar Affour ◽  
Christian Dufaza
Keyword(s):  
Yield Optimization ◽  
Parametric Yield
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