Identifying Reliability-critical Primary Inputs of Combinational Circuits based on the Model of Gate-sensitive Attributes

Author(s):  
Jie Xiao ◽  
Wenbo Chen ◽  
Jungang Lou ◽  
Jianhui Jiang ◽  
Qianwei Zhou
Author(s):  
A. L. Stempkovskiy ◽  
◽  
D. V. Telpukhov ◽  
A. I. Demeneva ◽  
T. D. Zhukova ◽  
...  

2013 ◽  
Vol 9 (4) ◽  
pp. 514-520
Author(s):  
P. Balasubramanian ◽  
K. Prasad

2002 ◽  
Vol 42 (7) ◽  
pp. 1141-1149 ◽  
Author(s):  
T Cibáková ◽  
M Fischerová ◽  
E Gramatová ◽  
W Kuzmicz ◽  
W.A Pleskacz ◽  
...  

2009 ◽  
Vol 56 (6) ◽  
pp. 3122-3129 ◽  
Author(s):  
Liu Biwei ◽  
Chen Shuming ◽  
Liang Bin ◽  
Liu Zheng ◽  
Zhao Zhenyu

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