Fully-Integrated Charge Pump Design Optimization for Above-Breakdown Biasing of Single-Photon Avalanche Diodes in 0.13- $\mu$ m CMOS

2019 ◽  
Vol 66 (3) ◽  
pp. 1258-1269
Author(s):  
Boyu Shen ◽  
Soumya Bose ◽  
Matthew L. Johnston
Author(s):  
Fabio Signorelli ◽  
Fabio Telesca ◽  
Enrico Conca ◽  
Adriano Della Frera ◽  
Alessandro Ruggeri ◽  
...  

2014 ◽  
Vol 32 (21) ◽  
pp. 4097-4103 ◽  
Author(s):  
Michael A. Wayne ◽  
Alessandro Restelli ◽  
Joshua C. Bienfang ◽  
Paul G. Kwiat

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