High-Field Stress, Low-Frequency Noise, and Long-Term Reliability of AlGaN/GaN HEMTs
2016 ◽
Vol 16
(3)
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pp. 282-289
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Keyword(s):
1999 ◽
Keyword(s):
2018 ◽
Vol 65
(4)
◽
pp. 1321-1326
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Keyword(s):
2001 ◽
Vol 40
(Part 1, No. 12)
◽
pp. 6770-6777
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2017 ◽
Vol 38
(8)
◽
pp. 1109-1112
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Keyword(s):