scholarly journals High-Field Stress, Low-Frequency Noise, and Long-Term Reliability of AlGaN/GaN HEMTs

2016 ◽  
Vol 16 (3) ◽  
pp. 282-289 ◽  
Author(s):  
Jin Chen ◽  
Yevgeniy S. Puzyrev ◽  
En Xia Zhang ◽  
Daniel M. Fleetwood ◽  
Ronald D. Schrimpf ◽  
...  
1999 ◽  
Author(s):  
J. A. Garrido ◽  
F. Calle ◽  
E. Muñoz ◽  
I. Izpura ◽  
J. L. Sánchez-Rojas ◽  
...  

2018 ◽  
Vol 65 (4) ◽  
pp. 1321-1326 ◽  
Author(s):  
Y. Q. Chen ◽  
Y. C. Zhang ◽  
Y. Liu ◽  
X. Y. Liao ◽  
Y. F. En ◽  
...  

Author(s):  
Daniel M. Fleetwood ◽  
Ronald D. Schrimpf ◽  
En Xia Zhang ◽  
Sokrates T. Pantelides

2017 ◽  
Vol 38 (8) ◽  
pp. 1109-1112 ◽  
Author(s):  
Nandha Kumar Subramani ◽  
Julien Couvidat ◽  
Ahmad Al Hajjar ◽  
Jean-Christophe Nallatamby ◽  
Didier Floriot ◽  
...  

Sign in / Sign up

Export Citation Format

Share Document