Device reliability study of GaN HEMTs using both low frequency noise and microwave noise temperature spectroscopy

Author(s):  
Hemant Rao ◽  
Gijs Bosman
1999 ◽  
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J. A. Garrido ◽  
F. Calle ◽  
E. Muñoz ◽  
I. Izpura ◽  
J. L. Sánchez-Rojas ◽  
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Y. C. Zhang ◽  
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Y. F. En ◽  
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pp. 1109-1112 ◽  
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