Degradation of Ka-Band GaN LNA Under High-Input Power Stress: Experimental and Theoretical Insights

2019 ◽  
Vol 66 (12) ◽  
pp. 5091-5096
Author(s):  
Xiaodong Tong ◽  
Rong Wang ◽  
Shiyong Zhang ◽  
Jianxing Xu ◽  
Penghui Zheng ◽  
...  
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