scholarly journals Reliability of Logic-in-Memory Circuits in Resistive Memory Arrays

2020 ◽  
Vol 67 (11) ◽  
pp. 4611-4615
Author(s):  
Tommaso Zanotti ◽  
Cristian Zambelli ◽  
Francesco Maria Puglisi ◽  
Valerio Milo ◽  
Eduardo Perez ◽  
...  
2021 ◽  
pp. 2000222
Author(s):  
Shruti Nirantar ◽  
Md Ataur Rahman ◽  
Edwin Mayes ◽  
Madhu Bhaskaran ◽  
Sumeet Walia ◽  
...  

2014 ◽  
Vol 26 (44) ◽  
pp. 7418-7418
Author(s):  
Seungjun Kim ◽  
Jung Hwan Son ◽  
Seung Hyun Lee ◽  
Byoung Kuk You ◽  
Kwi-Il Park ◽  
...  

2014 ◽  
Vol 26 (44) ◽  
pp. 7480-7487 ◽  
Author(s):  
Seungjun Kim ◽  
Jung Hwan Son ◽  
Seung Hyun Lee ◽  
Byoung Kuk You ◽  
Kwi-Il Park ◽  
...  

2015 ◽  
Vol 62 (6) ◽  
pp. 2606-2612 ◽  
Author(s):  
Debayan Mahalanabis ◽  
Rui Liu ◽  
Hugh J. Barnaby ◽  
Shimeng Yu ◽  
Michael N. Kozicki ◽  
...  

2015 ◽  
Vol 62 (10) ◽  
pp. 3160-3167 ◽  
Author(s):  
Haitong Li ◽  
Bin Gao ◽  
Hong-Yu Henry Chen ◽  
Zhe Chen ◽  
Peng Huang ◽  
...  

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