Built-in self-test in a 24 bit floating point digital signal processor

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H. Sawai ◽  
E. Teraoka ◽  
T. Fujiyama ◽  
T. Kengaku ◽  
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IEEE Micro ◽  
1988 ◽  
Vol 8 (6) ◽  
pp. 30-48 ◽  
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M.L. Fuccio ◽  
R.N. Gadenz ◽  
C.J. Garen ◽  
J.M. Huser ◽  
B. Ng ◽  
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1991 ◽  
Vol 4 (3) ◽  
pp. 188-195 ◽  
Author(s):  
Edward L. Siegel ◽  
Arch W. Templeton ◽  
Kenneth L. Hensley ◽  
Michael A. McFadden ◽  
Kirkman G. Baxter ◽  
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2003 ◽  
Author(s):  
K.L. Kloker ◽  
B. Lindsley ◽  
S. Liberman ◽  
P. Marino ◽  
E. Rushinek ◽  
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