IEEE Radiation Effects Data Workshop, 2005.
Latest Publications

TOTAL DOCUMENTS

37

(FIVE YEARS 0)

H-INDEX

5

(FIVE YEARS 0)

Published By IEEE

0780393678

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Total dose degradation of low-dropout voltage regulators

IEEE Radiation Effects Data Workshop, 2005. ◽

10.1109/redw.2005.1532678 ◽

2005 ◽

Author(s):

T.F. Miyahira ◽

B.G. Rax ◽

A.H. Johnston

Keyword(s):

Voltage Regulators

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Single event transients in operational amplifiers

IEEE Radiation Effects Data Workshop, 2005. ◽

10.1109/redw.2005.1532658 ◽

2005 ◽

Author(s):

J. George ◽

R. Koga ◽

S. Crain ◽

P. Yu ◽

S. Nguyen ◽

...

Keyword(s):

Operational Amplifiers ◽

Single Event ◽

Single Event Transients

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Dynamic single event upset characterization of the virtex-IIPro's embedded IBM PowerPC405 using proton irradiation

IEEE Radiation Effects Data Workshop, 2005. ◽

10.1109/redw.2005.1532665 ◽

2005 ◽

Author(s):

F. Chayab ◽

D.M. Hiemstra ◽

R. Ronge

Keyword(s):

Proton Irradiation ◽

Single Event Upset ◽

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Heavy ion and proton see characterization of COTS 0.22μm field programmable gate arrays

IEEE Radiation Effects Data Workshop, 2005. ◽

10.1109/redw.2005.1532666 ◽

2005 ◽

Author(s):

R. Koga ◽

K. Crawford ◽

P. Yu ◽

J. George ◽

S. Crain ◽

...

Keyword(s):

Field Programmable Gate Arrays ◽

Heavy Ion ◽

Gate Arrays ◽

Field Programmable ◽

Programmable Gate Arrays

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Radiation hardness evaluation of a class V 32-bit floating-point digital signal processor

IEEE Radiation Effects Data Workshop, 2005. ◽

10.1109/redw.2005.1532669 ◽

2005 ◽

Author(s):

R. Joshi ◽

R. Daniels ◽

M. Shoga ◽

M. Gauthier

Keyword(s):

Digital Signal Processor ◽

Digital Signal ◽

Radiation Hardness ◽

Floating Point ◽

Class V ◽

Signal Processor

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Single event upset characterization of the ESP603 single board space computer with the PowerPC603R processor using proton irradiation

IEEE Radiation Effects Data Workshop, 2005. ◽

10.1109/redw.2005.1532668 ◽

2005 ◽

Author(s):

H. Rufenacht ◽

D.M. Hiemstra ◽

R. Ronge ◽

T. Klincsek ◽

Kim Anh Le ◽

...

Keyword(s):

Proton Irradiation ◽

Single Event Upset ◽

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Recent total ionizing dose results and displacement damage results for candidate spacecraft electronics for NASA

IEEE Radiation Effects Data Workshop, 2005. ◽

10.1109/redw.2005.1532682 ◽

2005 ◽

Author(s):

D.J. Cochran ◽

S.D. Kniffin ◽

R.L. Ladbury ◽

M.V. O'Bryan ◽

C.F. Poivey ◽

...

Keyword(s):

Total Ionizing Dose ◽

Displacement Damage

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COTS ADC & amp; DAC selection and qualification for the GLAST mission

IEEE Radiation Effects Data Workshop, 2005. ◽

10.1109/redw.2005.1532670 ◽

2005 ◽

Author(s):

J. Ampe ◽

V. Thai ◽

S. Buchner ◽

S. Kniffin ◽

W.N. Johnson

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Compendia of radiation test results of integrated circuits

IEEE Radiation Effects Data Workshop, 2005. ◽

10.1109/redw.2005.1532683 ◽

2005 ◽

Author(s):

P. Layton ◽

E. Patnaude ◽

G. Williamson ◽

L. Longden ◽

C. Sloan

Keyword(s):

Integrated Circuits ◽

Test Results ◽

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The ionizing radiation environment on the international space station: performance vs. expectations for avionics and materials

IEEE Radiation Effects Data Workshop, 2005. ◽

10.1109/redw.2005.1532675 ◽

2005 ◽

Author(s):

S.L. Koontz ◽

P.A. Boeder ◽

C. Pankop ◽

B. Reddell

Keyword(s):

Ionizing Radiation ◽

International Space Station ◽

Space Station ◽

Radiation Environment ◽

International Space

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