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Test access mechanism for multiple identical cores
2009 International Test Conference
◽
10.1109/test.2009.5355560
◽
2009
◽
Cited By ~ 8
Author(s):
Grady Giles
◽
Jing Wang
◽
Anuja Sehgal
◽
Kedarnath J. Balakrishnan
◽
James Wingfield
Keyword(s):
Test Access Mechanism
Download Full-text
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Testing TAPed cores and wrapped cores with the same test access mechanism
Proceedings Design, Automation and Test in Europe. Conference and Exhibition 2001
◽
10.1109/date.2001.915016
◽
2002
◽
Cited By ~ 5
Author(s):
M. Benabdenbi
◽
W. Maroufi
◽
M. Marzouki
Keyword(s):
Test Access Mechanism
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Multi-valued logic test access mechanism for test time and power reduction
2015 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS)
◽
10.1109/dtis.2015.7127351
◽
2015
◽
Cited By ~ 2
Author(s):
Amirreza Nekooei
◽
Zainalabedin Navabi
Keyword(s):
Power Reduction
◽
Test Time
◽
Test Access Mechanism
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Hardware Trojan Attacks in Analog/Mixed-Signal ICs via the Test Access Mechanism
2020 IEEE European Test Symposium (ETS)
◽
10.1109/ets48528.2020.9131560
◽
2020
◽
Cited By ~ 1
Author(s):
Mohamed Elshamy
◽
Giorgio Di Natale
◽
Antonios Pavlidis
◽
Marie-Minerve Louerat
◽
Haralampos-G. Stratigopoulos
Keyword(s):
Hardware Trojan
◽
Mixed Signal
◽
Test Access Mechanism
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Re-Examining the Use of Network-on-Chip as Test Access Mechanism
2008 Design, Automation and Test in Europe
◽
10.1109/date.2008.4484917
◽
2008
◽
Cited By ~ 3
Author(s):
Feng Yuan
◽
Lin Huang
◽
Qiang Xu
Keyword(s):
Network On Chip
◽
Test Access Mechanism
◽
On Chip
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On-chip Scan-Based Test Strategy for a Dependable Many-Core Processor Using a NoC as a Test Access Mechanism
2010 13th Euromicro Conference on Digital System Design: Architectures, Methods and Tools
◽
10.1109/dsd.2010.16
◽
2010
◽
Cited By ~ 5
Author(s):
Xiao Zhang
◽
Hans G. Kerkhoff
◽
Bart Vermeulen
Keyword(s):
Test Strategy
◽
Test Access Mechanism
◽
On Chip
◽
Many Core
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Contactless Test Access Mechanism for TSV-Based 3-D ICs Utilizing Capacitive Coupling
IEEE Transactions on Instrumentation and Measurement
◽
10.1109/tim.2015.2477240
◽
2016
◽
Vol 65
(1)
◽
pp. 88-95
◽
Cited By ~ 5
Author(s):
Iftekhar Ibne Basith
◽
Rashid Rashidzadeh
Keyword(s):
Capacitive Coupling
◽
Test Access Mechanism
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A compression-driven test access mechanism design approach
Proceedings. Ninth IEEE European Test Symposium, 2004. ETS 2004.
◽
10.1109/etsym.2004.1347617
◽
2004
◽
Cited By ~ 16
Author(s):
P.T. Gonciari
◽
B.M. Al-Hashimi
Keyword(s):
Mechanism Design
◽
Design Approach
◽
Test Access Mechanism
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Bandwidth Analysis of Functional Interconnects Used as Test Access Mechanism
Journal of Electronic Testing
◽
10.1007/s10836-010-5163-x
◽
2010
◽
Vol 26
(4)
◽
pp. 453-464
Author(s):
Ardy van den Berg
◽
Pengwei Ren
◽
Erik Jan Marinissen
◽
Georgi Gaydadjiev
◽
Kees Goossens
Keyword(s):
Test Access Mechanism
◽
Bandwidth Analysis
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Test Access Mechanism for Multiple Identical Cores
2008 IEEE International Test Conference
◽
10.1109/test.2008.4700553
◽
2008
◽
Cited By ~ 21
Author(s):
G. Giles
◽
J. Wang
◽
A. Sehgal
◽
K.J. Balakrishnan
◽
J. Wingfield
Keyword(s):
Test Access Mechanism
Download Full-text
New scan-based test strategy for a dependable many-core processor using a NoC as a Test Access Mechanism
2010 15th IEEE European Test Symposium
◽
10.1109/etsym.2010.5512748
◽
2010
◽
Cited By ~ 1
Author(s):
Xiao Zhang
◽
Hans G. Kerkhoff
◽
Bart Vermeulen
Keyword(s):
Test Strategy
◽
Test Access Mechanism
◽
Many Core
Download Full-text
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