Precision Measurement of Thermal Diffusivity for Thin Layers by a Customised Laser Pulse Method

Author(s):  
Benedict Volker ◽  
Daniel May ◽  
Mohamad Abo Ras ◽  
Corinna Grosse ◽  
Bernhard Wunderle ◽  
...  
1968 ◽  
Vol 7 (6) ◽  
pp. 682-682 ◽  
Author(s):  
Shōichi Nasu ◽  
Susumu Fukushima ◽  
Toshihiko Ohmichi ◽  
Takeo Kikuchi

2010 ◽  
Vol 14 (2) ◽  
pp. 417-423 ◽  
Author(s):  
Nenad Milosevic

Paper presents results of measuring thermal diffusivity of translucent or partially transparent thin discs of non-metals such as alumina and silicon using most widely spread experimental technique, the standard laser pulse method. Difficulties in its application to such materials are discussed. The thermal diffusivity has been measured from room temperature up to 900?C for alumina, and to 1200?C for silicon. Obtained results are analyzed and compared with available literature data and existing recommended functions.


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