Vibrating Reed Electrometer With Attocoulomb Charge Resolution and Subattoampere Current Resolution

2013 ◽  
Vol 62 (1) ◽  
pp. 192-198 ◽  
Author(s):  
Gert Rietveld
Author(s):  
E. B. Steel

High Purity Germanium (HPGe) x-ray detectors are now commercially available for the analytical electron microscope (AEM). The detectors have superior efficiency at high x-ray energies and superior resolution compared to traditional lithium-drifted silicon [Si(Li)] detectors. However, just as for the Si(Li), the use of the HPGe detectors requires the determination of sensitivity factors for the quantitative chemical analysis of specimens in the AEM. Detector performance, including incomplete charge, resolution, and durability has been compared to a first generation detector. Sensitivity factors for many elements with atomic numbers 10 through 92 have been determined at 100, 200, and 300 keV. This data is compared to Si(Li) detector sensitivity factors.The overall sensitivity and utility of high energy K-lines are reviewed and discussed. Many instruments have one or more high energy K-line backgrounds that will affect specific analytes. One detector-instrument-specimen holder combination had a consistent Pb K-line background while another had a W K-line background.


1995 ◽  
Vol 246 (1-2) ◽  
pp. 123-132 ◽  
Author(s):  
K. Rogacki ◽  
P. Esquinazi ◽  
E. Faulhaber ◽  
W. Sadowski

1989 ◽  
Vol 60 (11) ◽  
pp. 3569-3569
Author(s):  
H. J. Richter ◽  
K. A. Hempel ◽  
J. Pfeiffer
Keyword(s):  

1973 ◽  
Vol 4 (1) ◽  
pp. 61-67 ◽  
Author(s):  
Shigeharu Onogi ◽  
Takeshi Kondo ◽  
Yoshishige Tabata

1994 ◽  
Vol 50 (18) ◽  
pp. 13845-13848 ◽  
Author(s):  
X. D. Shi ◽  
P. M. Chaikin ◽  
N. P. Ong ◽  
Z. Z. Wang

1991 ◽  
Vol 104 (12) ◽  
pp. 1753-1770 ◽  
Author(s):  
T. Kobayashi ◽  
M. Fujii ◽  
J. Nishimura ◽  
T. Taira ◽  
H. Aizu ◽  
...  
Keyword(s):  
X Ray ◽  

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