Simulation of Single-Particle Displacement Damage in Silicon—Part III: First Principle Characterization of Defect Properties
2018 ◽
Vol 65
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pp. 724-731
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2014 ◽
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Vol 60
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pp. 4094-4102
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2021 ◽
Vol 2133
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Vol 65
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pp. 206-210
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pp. 1273-1283
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